In order to analyze the morphology and material properties of the deposited Ti thin-film structures and the HA-like mineral layer deposited on generated thin film after soaking in SBF, a Scanning Electron Microscope (SEM) and an EDAX Genesis 4000 Energy Dispersive X-Ray (EDS) analyzer were used. A Rigaku Ultima IV X-ray diffractometer (XRD) using Cu Kα radiation (λ = 0.15418 nm, 40 kV and 44 mA) and a Renishaw inVia Raman spectrometer (514 nm argon ion laser with a 25 mW power; repeated acquisitions: 40 scans with an acquisition time of 10 s at a 50 × magnification) were utilized for the structural identification of deposited titania coatings and HA-like layers formed on them.
Genesis 4000
Manufactured by Ametek
Sourced in United States
The Genesis 4000 is a laboratory equipment product designed for analytical applications. It features advanced technology and precise measurement capabilities. The core function of the Genesis 4000 is to provide accurate and reliable data for various scientific and research purposes.
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Lab products found in correlation
4 protocols using genesis 4000
1
Characterization of Ti Thin-Film Coatings
2
Cuprous Oxide Morphology Characterization
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The morphology of cuprous oxide samples was investigated using TEM and SEM at Friedrich-Schiller University (FSU) and the University of New Brunswick (UNB). A suspension of Cu2O (0.5 mg/mL) was deposited onto a nickel grid (TEM) or ultra-smooth glassy background (SEM). A JEOL JSM-6400 SEM (Jeol Ltd., Tokyo, Japan), equipped with an EDAX Genesis 4000 energy dispersive X-Ray (EDX) analyzer, was used at an accelerating voltage of 15 kV (UNB). High resolution TEM (HRTEM) was carried out with a JEOL 3010 and JEOL NeoARM TEM (Jeol Ltd., Tokyo, Japan).
3
Nanocomposite Surface Morphology Analysis
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The surface morphology of CS/Si, CS/Si/HAp, CS/Si/HAp/Ca-GP, CS/Si/Ca-GP, CS/Si/HAp/Na-GP, and CS/Si/Na-GP nanocomposites was investigated using scanning electron microscopy (FEI model Quanta 200F, Thermo Fisher Scientific, Hillsboro, OR, USA), coupled with a field emission gun (FEG) and energy dispersive spectroscopy (EDS) equipment (EDAX model Genesis 4000). Experiments were performed under a nitrogen atmosphere at a pressure of 100 Pa (low vacuum operating mode). This mode avoids coating the sample with a thin conductive layer, such as gold or carbon, which is important in order not to distort the surface topography.
4
Characterizing Algal Cell Responses to Silver Nanoparticles
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A drop of the algal suspension after the exposure to the three Ag suspensions (50 μg/L for the AgNPs, 10 μg/L for Ag+) for 8 h was air-dried onto a copper grid and the morphology of algal cells was observed with the TEM. To observe potential changes of the cellular structure, the treated and untreated algal cells were fixed in 2.5% glutaraldehyde, dehydrated by ethanol and acetone, embedded, stained with OsO4, sectioned, counterstained, and then observed by the TEM with the same method applied in our previous studies57 68 (link)69 (link). Both the intact cells and sectioned cells were analyzed by the EDS (GENESIS 4000, EDAX Inc., USA) to determine the Ag contents on and in the cells, respectively70 45 .
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