Powder x ray diffractometer

An X-ray powder diffractometer (Rigaku, Tokyo, Japan) equipped with a Cu-Kα radiation (λ = 1.541 Å) source was used to analyze the amorphous state. The tube voltage and amperage were maintained at 40 kV and 40 mA, respectively. For conducting continuous determinations, XRPD data were collected within the 2θ range from 5° to 45°. Scanning speed and step size were set to 10°/min and 0.04°, respectively.

Crystallinity index (CrI) of nanocomposites was analyzed from X-ray diffraction (XRD) profiles measured with an X-ray powder diffractometer (Rigaku Corporation, Tokyo, Japan) equipped with nickel filtered Cu Kα radiation (λ = 0.1542 nm). The X-ray pattern was recorded in a 2θ range of 5–50° at 40 kV and 25 mA as well as at a scan rate of 2° min⁻¹ [20 (link),21 (link)]. The CrI was calculated based on Equation (1)
$C_{r}I=\left[\left(I_{002}-I_{\mathrm{am}}\right)/I_{002}\right]\times 100\%$
where, I₀₀₂ was diffraction peak intensity from (002) plain at 2θ = 23°, which corresponds to a specific diffraction peak of the crystalline portion. I_am refers to the intensity at about 2θ = 18°, and it refers to the amorphous region [21 (link)].

The samples with formula (Ca_2.83−xEu_0.17Bi_x)ZrSi₂O₉ (x = 0–0.16) were synthesized by the high-temperature solid-state reaction method. The starting materials consisting of CaCO₃ (Aldrich, 99.95%), Bi₂O₃ (Aldrich, 99.9%), ZrO₂ (Aldrich, 99.5%), SiO₂ (Aldrich, 99.99%) and Eu₂O₃ (Aldrich, 99.95%) were weighed according to the stoichiometric ratio. The mixed powder was evenly ground in an agate mortar, and then the homogeneous mixtures were placed in an alumina crucible and continually heated at 1400 °C in an air atmosphere for 6 h. The samples were gradually cooled to room temperature and then ground once more until a fine powder was obtained.
The powder X-ray diffraction (XRD) patterns were measured using an X-ray powder diffractometer (Rigaku, Japan) with Cu-Kα radiation (λ = 1.5406 Å). The photoluminescence spectra and the decay curves of Eu³⁺ lifetime values were measured using a FLS-980 fluorescence spectrophotometer (Edinburgh Instruments) equipped with a xenon lamp (450 W, Osram) as the excitation source. The quantum yield and temperature-dependent emission spectra were measured using the QE-2100 quantum yield measurement system (Otsuka Electronics Co., Ltd., Japan), composed of an integrating sphere, a heating apparatus, and a Xe lamp used as an excitation source and white BaSO₄ powder as a reference.

The crystallinity analysis of the PP/CNF nanocomposite in this study was conducted using an X-ray powder diffractometer (Rigaku Corporation, Tokyo, Japan) equipped with a nickel Cu Kα radiation source (λ = 0.1542 nm) at 50 kV and 300 mA. The diffractograms were detected in the range 2θ = 5 to 50° at room temperature. The crystallinity index (CrI) was calculated based on Equation (1): $CrI= \frac{ I002-I\mathrm{am}}{I002}\times 100\%$
Note that I₀₀₂ at an angle of 2θ = 23 and I_am at an angle of 2θ = 18 correspond to the cellulose and amorphous region, respectively [37 (link)].