Mini 2 system
The MINI II system is a compact and versatile instrument designed for particle size analysis. It utilizes laser diffraction technology to measure the size distribution of particles ranging from 0.01 to 3,500 microns. The system provides accurate and reproducible results, making it a reliable tool for various applications.
2 protocols using mini 2 system
Comprehensive Characterization of Novel Material
Synthesis and Characterization of Mesoporous Materials
The characterization studies were performed by X-Ray diffraction (XRD) employing a Philips X’PertPro diffractometer using CuKa radiation (operating at 40 kV and 40 mA); UV–Vis spectroscopy (PerkinElmer Lambda 25 spectrophotometer); Fourier transform infrared (FTIR) spectra (Shimadzu-8900 spectrometer); field emission scanning electron microscopy (FESEM) using a TESCAN electron microscope operating at 30 kV; and specific surface area (BET) measurement employing a BELSORP mini II system. This equipment was also utilized to calculate the pore distribution by the BJH method.
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