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Mini 2 system

Manufactured by Microtrac

The MINI II system is a compact and versatile instrument designed for particle size analysis. It utilizes laser diffraction technology to measure the size distribution of particles ranging from 0.01 to 3,500 microns. The system provides accurate and reproducible results, making it a reliable tool for various applications.

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2 protocols using mini 2 system

1

Comprehensive Characterization of Novel Material

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Fourier transform infrared (FT-IR) spectra was registered on an ALPHA-Bruker spectrometer from 400 to 4000 cm−1, using KBr pellet. 1H-NMR (300 MHz) and 13C-NMR (75 MHz) were carried out in CDCl3 on a Bruker-Avance spectrometer. The thermogravimetry analysis (TGA) was performed on a Q600 TA instrument under an argon atmosphere at 25–800 °C. X-ray diffraction (XRD) data were examined by X’Pert- MPD PRO-PW3040/60 instrument. The surface morphology and atomic distribution were obtained by field emission scanning electron microscope (FE-SEM) brand TESCAN (MIRA 3 LMU). Zeiss EM900 microscope was used for Transmission electron microscopy (TEM) analysis. The surface area, pore volume, and pore size distribution were characterized on a BELSORP MINI II system at 77 K using N2 as the adsorbate. The UV–Visible (UV–Vis) spectra of the methyl red dye solutions were recorded using a UV-2550 spectrophotometer.
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2

Synthesis and Characterization of Mesoporous Materials

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All chemicals were of analytical grade. Thus, they were used without further purification. Metal salts, methanol, hydrochloric acid, and sodium hydroxide were purchased from Merck (Merck Co., Darmstadt, Germany). Additionally, cetyltrimethylammonium bromide (CTMABr), tetraethyl orthosilicate (TEOS), and Pluronic P123 (EO20PO70EO20, Mav = 5800) were provided by Sigma–Aldrich (Sigma–Aldrich Co, Darmstadt, Germany). Double distilled water was employed to prepare aqueous solutions.
The characterization studies were performed by X-Ray diffraction (XRD) employing a Philips X’PertPro diffractometer using CuKa radiation (operating at 40 kV and 40 mA); UV–Vis spectroscopy (PerkinElmer Lambda 25 spectrophotometer); Fourier transform infrared (FTIR) spectra (Shimadzu-8900 spectrometer); field emission scanning electron microscopy (FESEM) using a TESCAN electron microscope operating at 30 kV; and specific surface area (BET) measurement employing a BELSORP mini II system. This equipment was also utilized to calculate the pore distribution by the BJH method.
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