HR-TEM imaging, selected area electron diffraction and energy dispersive X-ray (EDX) spot analysis were acquired using a Field-Emission-Gun-Transmission-Electron microscope (FEI Tecnai TF20) fitted with a CCD Camera (Gatan Orius SC600A) and an EDX spectrometer (Oxford Instruments 80 mm2 X-max). The microscope was operated at 200 kV. To avoid beam damage, the exposure for image collection was limited to maximum 0.25 s. Images were analyzed using the ImageJ software37 (link). Atomic plane distances were calculated from the fast FFT analyses of several particles from the each acquired high-resolution image and from different areas in each image. The lattice planar distances were then calculated from the reciprocal values of the distance from the spots to the center (Supplementary Table
Tecnai tf20
The Tecnai TF20 is a transmission electron microscope (TEM) designed for high-resolution imaging and analysis of materials at the nanoscale. It features a field emission electron source, advanced optics, and a high-performance digital camera system for capturing detailed images and data.
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2 protocols using tecnai tf20
Anaerobic TEM Imaging of Reactive Samples
HR-TEM imaging, selected area electron diffraction and energy dispersive X-ray (EDX) spot analysis were acquired using a Field-Emission-Gun-Transmission-Electron microscope (FEI Tecnai TF20) fitted with a CCD Camera (Gatan Orius SC600A) and an EDX spectrometer (Oxford Instruments 80 mm2 X-max). The microscope was operated at 200 kV. To avoid beam damage, the exposure for image collection was limited to maximum 0.25 s. Images were analyzed using the ImageJ software37 (link). Atomic plane distances were calculated from the fast FFT analyses of several particles from the each acquired high-resolution image and from different areas in each image. The lattice planar distances were then calculated from the reciprocal values of the distance from the spots to the center (Supplementary Table
Purification and Visualization of P. multocida Phage
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