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Energy dispersive x ray spectroscopy eds system

Manufactured by Oxford Instruments
Sourced in United Kingdom

Energy-dispersive X-ray spectroscopy (EDS) is an analytical technique used to identify the elemental composition of a sample. It measures the energy of the X-rays emitted by the sample when it is bombarded with an electron beam. The energy of the X-rays is characteristic of the elements present in the sample, allowing their identification.

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2 protocols using energy dispersive x ray spectroscopy eds system

1

Structural Characterization of Zr-Pd Alloy

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X-ray diffraction (XRD), with Cu-Kα radiation using a 9 kW. Intelligent X-ray diffraction system that was provided by SmartLab-Rigaku, Akishima-shi, Tokyo-Japan, was used to investigate the general crystal structure of all samples. A field emission high-resolution transmission electron microscope (FE-HRTEM) operated at 200 kV (2100F-field emission high resolution, supplied by JEOL, Musashino, Akishima, Tokyo-Japan) was used to study the structure and morphology of samples. The microscope was equipped with a scanning transmission electron microscopy (STEM) unit interfaced with an energy-dispersive X-ray spectroscopy (EDS) system, supplied by Oxford Instruments, Abingdon-UK. These units were employed to conduct the local elemental analysis of the samples. However, the chemical composition of some samples were determined using inductively coupled plasma mass spectrometry (ICP-MS) provided by Shimadzu Scientific Instruments, Saitama-Japan.
The XRD pattern of the starting mixture powder of Zr67Pd33 is presented in Fig. 2. The powders at this initial stage (0 h) of MA revealed high-intensity Bragg peaks, corresponding to hcp-Zr and fcc-Pd metals (Fig. 2a). After 25 h of MA time, these elemental Bragg lines were replaced by a halo-diffuse pattern (Fig. 2b), implying the formation of amorphous Zr2Pd.
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2

Scanning Electron Microscopy and EDS Analysis

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A ZEISS EVO MA 15 scanning electron microscope (SEM), coupled with an energy-dispersive X-ray spectroscopy (EDS) system (Oxford Instruments) and equipped with a silicon drift detector (SDD), a LaB6 filament as an electron source, and cobalt as a calibration standard, was employed for microstructural characterization and to determine the chemical compositions of samples. AZtec 3.3 software was used to collect and process SEM–EDS data. Small rock fragments and pigments were studied at 20 kV and an 8.5 mm working distance under variable pressure (VP) conditions. Images were captured using both back scattered electrons detector (BSD) and secondary electrons detector (SED). In order to preserve samples for future analyses, they were not coated and they were observed in variable pressure conditions. Moreover, SEM–EDS chemical mapping technique was applied to investigate elemental distribution within samples and to differentiate between rock, pigments, and patinas. Thus, for each pigment sample, micrographs, elemental mappings, and EDS spectra were acquired.
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