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V 670 pc

Manufactured by Jasco

The V-670 PC is a spectrophotometer designed for laboratory use. It measures the absorption or transmission of light through a sample over a specified wavelength range. The device can be used to analyze the composition or concentration of various substances.

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3 protocols using v 670 pc

1

Synthesis and Characterization of Cu2O-rGO-MXene Composite

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The formation of MG composite and crystallinity of Cu2O–rGO–MXene composite were confirmed with XRD (D8 Advance from Bruker, Cu Kα radiation) and Raman spectroscopy (512 nm laser—HORIBA). UV–Visible absorption spectrum was carried out with JASCO (V-670 PC) to examine the optical behavior of the prepared samples. The morphology and particle distribution of Cu2O nanoparticles on the rGO and MXene sheet in the composite was analyzed with FE-SEM (Thermo Fisher FEI Quanta 250 FEG) and HR-TEM (FEI-Tecnai G2 20 Twin). All the electrochemical measurements were carried out with CHI-600C workstation.
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2

Structural and Optical Analysis of Nanocrystals

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The phase and crystallographic structure of as-prepared nanocrystals were observed by a Powder X-ray diffractometer (Bruker, D8 Advance). The diffractograms were recorded for 2Ɵ in the range of 5–80°, with a time of 6 s. The SEM images were captured by scanning electron microscope SEM-ZEISS (EVO18)), Carl Zeiss Microscopy GmbH, 07745 Jena, Germany, before applying spectral coating using gold platinum metal (Quorum). The elemental analysis of the catalyst was analyzed by energy dispersive X-ray (EDX; VEGA3 XUM/TESCAN). UV-Visible absorption spectra were analyzed on JASCO (V-670 PC) equipment, with a wavelength range of 200–1000 nm at room temperature. The optical band gap of these materials was estimated using the Tauc equation.
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3

Characterization of Ag Nanoparticles

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Surface Plasmon Resonance (SPR) of the Ag NPs was recorded using a UV-Visible spectrophotometer (Jasco V-670PC). Functional group analysis of the extract and the Ag NPs was assessed by FT-IR spectrometer (Shimadzu, Japan). Crystalline phase analysis was performed by X-ray diffractometer (Bruker, D8 advance). SEM images of the sample were recorded using a scanning electron microscope (Quantachrome, USA).
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