The effect of each preparation step on the catalyst morphology was investigated by field emission scanning electron microscopy (Hitachi, Tokyo, Japan,
SU8020) at an accelerating voltage of 15.0 kV. The surface properties were determined by measuring the water contact angle using the static sessile drop method with a Contact angle analyzer (Phoenix 300, SEO, Suwon, Korea). The contact angle of the prepared catalysts (thickness = about 0.2 cm) was measured within 10 s after dropping water
The crystallinity of and impurities in the catalysts were analyzed using X-ray diffraction (XRD, Rigaku, Tokyo, Japan,
Ultima IV) with Cu Kα (λ = 0.15406 nm) radiation in the 2θ range of 10° to 80° at a scan rate of 1°/min. The Si and N elements in the catalysts were measured by X-ray photoelectron spectroscopy (XPS; Thermo VG Scientific, Waltham, MA, USA, K Alpha+) with Al Kα radiation; the binding energy of C1s was normalized to 284.8 eV. Fourier transform infrared spectroscopy (FT-IR, Varian Medical Systems, Palo Alto, CA, USA, 670 FTIR) was carried out over a wavelength range of 400–4000 cm
−1.
H
2-temperature-programmed reduction was carried out using an
AutoChem II 2920 (Micromeritics Instrument Corp., Norcross, GA, USA). The samples were exposed to a current of 10% H
2/Ar and measured in the 200–900 °C temperature range.
Lee M.S., Kim S.I., Jeong B., Park J.W., Kim T., Lee J.W., Kwon G, & Lee D.H. (2021). Ammonium Ion Enhanced V2O5-WO3/TiO2 Catalysts for Selective Catalytic Reduction with Ammonia. Nanomaterials, 11(10), 2677.