X pert powder x ray diffractometer
The X'Pert powder X-ray diffractometer is a laboratory instrument designed for the analysis of powdered solid samples. It utilizes X-ray diffraction technology to provide information about the crystalline structure and composition of materials.
Lab products found in correlation
14 protocols using x pert powder x ray diffractometer
Microstructural Analysis of Ti64-B4C Composite Powders
Powder X-ray Diffraction Characterization
Characterization of Nanomaterial Properties
Powder X-ray Diffraction Analysis of Cocrystals
Characterization of NiCo2Se4/rGO Composite
Characterization of YTP, Asphalt, and PbCrO4
Characterization of Pd/Co3O4 Catalyst
Electrochemical Characterization of Materials
Characterization of Metallogel Materials
Microstructure data was obtained using a Carl Zeiss SUPRA 55VP field-emission scanning electron microscope (FESEM). The energy-dispersive X-ray spectroscopy (EDX) analyses were carried out with a Bruker Super detector.
Fourier transform infrared spectra obtained through a JASCO FTIR 4700 spectrometer.
A PANALYTICAL X'pert powder X-ray diffractometer with Cu Kα1 radiation is employed to obtain the nature of the metallogels.
Raman analysis of metallogels are carried out using a HORIBA LABRAM HR evolution confocal Raman spectrometer with an excitation source of 532 nm (100 mW).
TGA is carried out at a heating rate of 10 °C min−1 under nitrogen atmosphere using Hitachi STA7200 analyzer.
To obtain the current–voltage (I–V) characteristics of our synthesized metallogel material-based thin film device, we utilized a Keithley 2612A Sourcemeter interfaced with a computer.
Structural Characterization of Synthesized Samples
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