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14 protocols using x pert powder x ray diffractometer

1

Microstructural Analysis of Ti64-B4C Composite Powders

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The morphology of the starting Ti64 (host) and B4C (guest) powders, as well as the composite powder systems, were studied using Vega Tescan scanning electron microscopy (SEM) operating at an accelerating voltage of 20 kV. The X-ray diffraction (XRD) analysis was employed to study the effect of the mixing method and the mixing time on the phase formation and the plastic deformation of the developed composite powder feedstocks. This analysis was performed at ambient temperature over a wide range of 2 θ= 20°–80° using a PANalytical X’Pert powder X-ray diffractometer (Westborough, MA, USA, Cu Kα target, operating at the voltage and the current of 45 kV and 35 mA, respectively, with a step size of 0.0167°) equipped with an X-ray monochromator. In order to have a better understanding of the microstructural features, the starting Ti64 and composite powders were also sectioned and characterized using SEM.
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2

Powder X-ray Diffraction Characterization

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Powder X-ray Diffraction (XPRD) patterns of the samples were collected by using a X’PERT POWDER X-ray diffractometer (PANalytical, Holland) in the θ/2θ scan mode with Cu-Kα radiation (λ = 1.540598 Å). Each X-ray diffractogram was recorded over a 2θ degree of 5° to 40° at a scanning step size of 0.01313° and a scanning rate of 2° per minute. Silicon was used as an external calibrant.
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3

Characterization of Nanomaterial Properties

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UV-visible absorbance spectra were obtained using a PerkinElmer Lambda 950 spectrophotometer equipped with deuterium and halogen lamps. Photoluminescence measurements were performed using a Fluoromax 4 from Horiba Scientific, and photoluminescence quantum yields were determined using a quanta-phi integrating sphere accessory according to a previously described procedure.69 (link) Powder X-ray diffraction (XRD) was measured on a PANalytical X'Pert Powder X-ray diffractometer. Transmission electron microscopy (TEM) was performed on a FEI T12 BioTWIN and a FEI Talos F200X. Fourier transform infrared (FT-IR) spectra were obtained using a PerkinElmer Spectrum One FT-IR Spectrometer operating with an attenuated total reflectance (ATR) accessory.
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4

Powder X-ray Diffraction Analysis of Cocrystals

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The X’PERT POWDER X-ray diffractometer (PANalytical, Holland) was used to collect the powder X-ray diffraction (PXRD) of samples in the θ/2θ scanning mode with Cu-Kα radiation (λ = 1.540598Å). The measurements were performed at room temperature, at a scan rate of 2°/min over a 2θ range of 4° to 50°. Silicon was used as an external calibrator. The PXRD of cocrystals were simulated by Mercury 4.3.0 at λ = 1.54056 Å, at a scan rate of 2°/min over a 2θ range of 5° to 50°.
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5

Characterization of NiCo2Se4/rGO Composite

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The hydrothermally synthesized product was characterized using a Philips X-Pert powder X-ray diffractometer (PANalytical, Almelo, The Netherlands) with CuKα (1.5418 Å) radiation. Although the sample was grown directly on Ni foam, in order to obtain conclusive pxrd pattern without any interference from metallic Ni (which shows high intensity diffraction peaks), the NiCo2Se4/rGO powder was scraped off from the surface of the Ni foam.
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6

Characterization of YTP, Asphalt, and PbCrO4

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Subsequent to producing powders suitable for PXRD, the samples of YTP, asphalt, and standard PbCrO4 were transferred into 16mmdiameter holders. Samples were analyzed using a Panalytical X’Pert Powder X-ray Diffractometer, equipped with an X’Celerator detector and spinning stage, and the resulting patterns processed following the methods described in O’Shea et al. (2020) (link), except that the X-ray patterns were recorded from 5°–90° 2θ and for a total run time of 2 h. After the dissolution experiments, none of the samples could be re-analyzed with PXRD, because not enough material was available.
A Panalytical Epsilon-1 Benchtop XRF Spectrometer was employed on the powdered samples for an initial determination of their elemental composition.
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7

Characterization of Pd/Co3O4 Catalyst

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XRD was carried out using a Panalytical X’Pert powder X-ray diffractometer with Cu Kα radiation (λ = 0.15418 nm). SEM images were obtained using a Quanta 400 FEG microscope (FEI Company). TEM images were carried out on a JEOL JEM-2010 (JEOL Ltd.). XPS measurements were performed in an ESCALAB 250 spectrometer. The ratio of Pd and Co3O4 was tested by ICP-OES (PerkinElmer, USA). Nitrogen adsorption isotherms were measured with a Beckman Coulter sorption analysis at 77 K in liquid nitrogen. Prior to measurements, the samples were degassed at 473 K for 10 h. Brunauer-Emmett-Teller (BET) surface area was calculated using experimented points at a relative pressure of p/p0 = 0.05–0.25. Pore size distribution (PSD) curve was calculated by the BJH (Barrett-Joyner-Halenda) method from desorption branch. Total pore volume was estimated by nitrogen amount adsorbed at a relative pressure (p/p0) of 0.99. All electrochemical measurements were carried out in 0.1 mol L−1 KOH solution using a standard three-electrode cell at 298 K by Solartron 1287. A platinum foil (3.0 cm2) was used as counter electrode, while a saturated calomel electrode with a salt bridge (SCE, 0.241 V versus SHE) was used as reference electrode.
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8

Electrochemical Characterization of Materials

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XRD was carried out using a Panalytical X’Pert powder X-ray diffractometer with Cu Kα radiation (λ = 0.15418 nm). SEM images were obtained using a Quanta 400 FEG microscope (FEI Company). Transmission electron microscopy (TEM) images were carried out on a JEOL JEM-2010 (JEOL Ltd.). Raman spectroscopic measurements were carried out on a Raman spectrometer (Renishaw Corp., UK) using a He–Ne laser with a wavelength of 514.5 nm. XPS measurements were performed in an ESCALAB 250 spectrometer under vacuum (about 2 × 10−9 mbar). All electrochemical measurements were carried out in 0.1 mol L−1 KOH solution by using the solartron 1287 electrochemical work station using a standard three-electrode cell at 298 K. Solutions were freshly prepared before each experiment. A platinum foil (3.0 cm2) was used as counter electrode. All the potentials were measured versus a saturated calomel electrode (SCE, 0.241 V versus SHE) electrode. A salt bridge was used between the cell and the reference electrode.
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9

Characterization of Metallogel Materials

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The mechanical study employed a rheometer manufactured by TA Instruments.
Microstructure data was obtained using a Carl Zeiss SUPRA 55VP field-emission scanning electron microscope (FESEM). The energy-dispersive X-ray spectroscopy (EDX) analyses were carried out with a Bruker Super detector.
Fourier transform infrared spectra obtained through a JASCO FTIR 4700 spectrometer.
A PANALYTICAL X'pert powder X-ray diffractometer with Cu Kα1 radiation is employed to obtain the nature of the metallogels.
Raman analysis of metallogels are carried out using a HORIBA LABRAM HR evolution confocal Raman spectrometer with an excitation source of 532 nm (100 mW).
TGA is carried out at a heating rate of 10 °C min−1 under nitrogen atmosphere using Hitachi STA7200 analyzer.
To obtain the current–voltage (IV) characteristics of our synthesized metallogel material-based thin film device, we utilized a Keithley 2612A Sourcemeter interfaced with a computer.
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10

Structural Characterization of Synthesized Samples

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The X-ray diffraction (XRD) data of as-synthesized samples were collected using a PANalytical X'pert Powder X-ray diffractometer equipped with a Cu Kα radiation operating at an accelerating voltage of 40 kV and current of 40 mA. For Rietveld refinement, the data was acquired in the 2θ range of 10–80° with 0.2028° min−1. For all the XRD measurements, to avoid any undesirable influence of air exposure, the as-obtained powders were sealed in an air-tight container with Kapton tape in an argon-filled glove box. The Rietveld refinements of the XRD data were carried out using Topas-Academic software.25 Raman scattering measurements were performed using DXR Raman Microscope with a 532 nm excitation source. In order to avoid any undesirable influence of air exposure, the as-obtained powders were sealed in an air-tight quartz box.
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