acquired using a JEOL JEM-1400plus TEM microscope operating at 120
kV. Samples for TEM imaging were prepared by dropcasting a toluene
solution of NCs onto a carbon-coated copper (400-mesh) TEM grid.
The JEM-1400plus is a Transmission Electron Microscope (TEM) manufactured by JEOL. It is designed to provide high-resolution imaging and analysis of various materials and samples. The JEM-1400plus offers a maximum accelerating voltage of 120 kV and is capable of achieving a resolution of 0.38 nm. The microscope is equipped with features to enable efficient sample handling and observation.
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