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Nsg03

Manufactured by NT-MDT

The NSG03 is a scanning probe microscope designed for high-resolution topographic imaging of surfaces. It features a compact and modular design, making it suitable for a variety of applications. The core function of the NSG03 is to provide high-quality, nanometer-scale surface characterization.

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6 protocols using nsg03

1

AFM Imaging and Analysis Protocol

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AFM images were acquired in air at room temperature using either an MFP3-3D (Asylum Research/Oxford Instruments, Goleta, CA, USA) or a SOLVER_Pro NT-MDT machine using either NSG30 (NT-MDT, Apeldoorn, The Netherlands, typical resonance frequency: 320 kHz; spring constant: 40 N/m), NSG03 (NT-MDT, Apeldoorn, The Netherlands), typical resonance frequency: 90 kHz; spring constant: 1.74 N/m), or AC240 (Olympus, Tokyo, Japan), resonance frequency: 70 kHz; spring constant: 2 N/m) cantilevers. All the AFM images were processed using WSxM software [29 (link)]; the contour length analysis was performed via 2D single molecule software [30 (link)] while and Igor Pro was used for the statistical analysis.
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2

Whirligig Beetle Corneal Topography

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To prepare corneal samples from freshly captured specimens, the head of a whirligig beetle was severed from the body, followed by removal of the mouth apparatus with a scalpel, splitting of the head into two hemispheres, and careful extraction of the brain tissue with forceps. Next, the cornea was cleared from the head capsule tissue as well as the underlying brain material with a scalpel. The sample was attached to a glass slide for AFM by means of a two-sided scotch tape. AFM scanning of the lens was performed with the Integra-Vita microscope (NT-MDT, Zelenograd, Russia). For the semi-contact procedure, the nitride silicon cantilever NSG 03 (NT-MDT) was used. The parameters of the cantilever were: length: 100 μm, resonant frequency: 62–123 kHz, radius: 10 nm, force constant: 0.4–2.7 N/m. For the contact procedure, the cantilever CSG 10 (NT-MDT) was used, with the following parameters: length: 250 μm, resonant frequency: 14–28 kHz, radius: 10 nm, force constant: 0.03–0.2 N/m. The choice between the semi-contact and the contact measuring procedures was dictated by the size and curvature of the studied surface of the sample, but provided essentially identical results. In each AFM experiment several scans were made to check the reproducibility of images and the absence of possible surface damages.
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3

Topographical Analysis of Samples by AFM

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The topographical analysis of the prepared samples was carried out by an NT-MDT NTEGRA SPM (Moscow, Russia) AFM in non-contact mode. Silicon nitride non-contact cantilevers with gold coating on the reflective side (NT-MDT, NSG03) and resonance frequencies between 50 and 150 kHz were used. The tips spring constant is between 0.35 and 6.06 N m−1, as measured by the Sader method.25 (link) The amplitude of oscillation was 10 nm, and the scan rate for 5 μm × 5 μm images was 1.0 Hz. The scanner used had a maximum range of 100 μm and was calibrated in x, y and z directions using 1.5 μm standard grids with a height of 22 nm.
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4

AFM Imaging of TDP-43 Aggregates

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TDP-43 in vitro-generated aggregates were dialysed against bi-distilled water at RT overnight and then subjected to atomic force microscopy (AFM) imaging. A volume of 10 μL was dropped onto freshly sliced muscovite mica (V-1) and incubated for 15 min for sample adhesion. The same volume of absolute ethanol was added, allowing the drop to evaporate. The sample was left to dry at RT and subjected to AFM imaging (NT-MDT Solver-Pro) in semi-contact mode, using commercial silicon cantilevers (NSG03, NT-MDT Spectrum Instruments, <10 nm radius of curvature, spring constant of 1.74 Nm−1).
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5

Surface Characterization of Polyphenol-Loaded Hydrogels

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A NTEGRA scanning probe microscope (NT-MDT Spectrum Instruments, Moscow, Russia), in atomic force microscopy (AFM) configuration, was used to collect the 2D and 3D surface images for the polyphenol-loaded XG/PVA composite hydrogel films. The film surfaces were scanned using rectangular silicon cantilevers NSG 03 (NT-MDT, Russia) having tips of equal height and aspect ratio. The Nova v.19891 for Solver software was used to process the AFM images and calculate the surface parameters [76 (link)].
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6

Topographic Imaging of AuNP Surfaces

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An NT-MDT NTEGRA SPM atomic force microscope (AFM) was used in non-contact mode to provide topographical images. Silicon nitride non-contact tips coated with Au on the reflective side (NT-MDT, NSG03) were used and had resonance frequencies between 65 and 100 kHz. The amplitude of oscillation was 10 nm, and the scan rate for 5 μm × 5 μm images was 0.5 Hz. All images were scaled relative to the maximum height for likesized AuNP immobilized surfaces.
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