Jsm 6480 scanning electron microscope
The JSM-6480 Scanning Electron Microscope is a high-performance instrument designed for detailed surface imaging and analysis. It utilizes a focused electron beam to scan the surface of a sample, generating images with high magnification and resolution. The JSM-6480 is capable of producing clear, detailed micrographs of a wide range of materials.
Lab products found in correlation
3 protocols using jsm 6480 scanning electron microscope
Deep-sea Bryozoan Specimen Analysis
Characterization of CaP Coatings on Titanium
The thickness of the CaP coatings was tested by the amplitude-sensitive eddy current method using the Dualscope FMP20 gauge (Helmut Fischer GmbH, Sindelfingen, Germany) with a probe FTA 3.3 (Helmut Fischer GmbH, Sindelfingen, Germany). Calibration was performed using the CpTi G4 substrate and 2 standard foils with a thickness of 24.3(5) and 48.2(1) μm (Helmut Fischer GmbH, Sindelfingen, Germany). For each sample, 30 thickness measurements were performed.
The surface roughness tests were carried out using a Mitutoyo Surftest SJ-500/P profilometer (Mitutoyo Polska Ltd., Wrocław, Poland). Measurements of changes in the surface profile were recorded 5 times for each sample on a sampling length of approximately 10 mm with a step of 0.1 μm and a speed of 200 μm s−1. In accordance with ISO 4287 [31 ], the recorded surface texture parameters were processed and developed using the FORMTRACEPAK computer program.
In each series of measurements, 10 samples were tested. The obtained results are presented as the mean value with standard deviation (SD).
Taxonomic Study of New Insect Taxa
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