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Jsm 6480 scanning electron microscope

Manufactured by JEOL
Sourced in United States

The JSM-6480 Scanning Electron Microscope is a high-performance instrument designed for detailed surface imaging and analysis. It utilizes a focused electron beam to scan the surface of a sample, generating images with high magnification and resolution. The JSM-6480 is capable of producing clear, detailed micrographs of a wide range of materials.

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3 protocols using jsm 6480 scanning electron microscope

1

Deep-sea Bryozoan Specimen Analysis

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Five specimens were examined from 46°59'45"S, 38°00'39"E, at depths of 360–376 m, between Marion and Prince Edward Island south of South Africa. The holotype was stained with methyl green for photography using a Canon EOS 7D camera with a Macro EF 100 mm lens and a Spot Flex CCD 15.2 fitted on a Leica MZ16 Stereo microscope at the Australian Museum, Sydney. The software Helicon Focus 5.3 was used for focus stacking. Another specimen from the same sample was dehydrated in ethanol, critical point dried, coated with 20 nm of gold and examined under a JEOL JSM-6480 Scanning Electron Microscope (SEM) at Macquarie University, Sydney. Terminology follows that of Hutchings et al. (2019). Data on the holotype are given, with the variations of the other material, all designated as paratypes, given in parentheses in the case of complete specimens. All material is deposited in Iziko Museums of South Africa (formerly South African Museum, Cape Town).
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2

Characterization of CaP Coatings on Titanium

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The surface morphology, chemical composition, and surface distribution of Ca, P, and Ti were studied using the JEOL JSM-6480 scanning electron microscope (SEM, Peabody, MA, USA), equipped with an energy dispersion spectroscopy (EDS) attachment. For each tested sample, 10 SEM images were taken.
The thickness of the CaP coatings was tested by the amplitude-sensitive eddy current method using the Dualscope FMP20 gauge (Helmut Fischer GmbH, Sindelfingen, Germany) with a probe FTA 3.3 (Helmut Fischer GmbH, Sindelfingen, Germany). Calibration was performed using the CpTi G4 substrate and 2 standard foils with a thickness of 24.3(5) and 48.2(1) μm (Helmut Fischer GmbH, Sindelfingen, Germany). For each sample, 30 thickness measurements were performed.
The surface roughness tests were carried out using a Mitutoyo Surftest SJ-500/P profilometer (Mitutoyo Polska Ltd., Wrocław, Poland). Measurements of changes in the surface profile were recorded 5 times for each sample on a sampling length of approximately 10 mm with a step of 0.1 μm and a speed of 200 μm s−1. In accordance with ISO 4287 [31 ], the recorded surface texture parameters were processed and developed using the FORMTRACEPAK computer program.
In each series of measurements, 10 samples were tested. The obtained results are presented as the mean value with standard deviation (SD).
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3

Taxonomic Study of New Insect Taxa

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Thirty-five specimens (excluding juveniles) belonging to the new taxon were collected on the host plants by sweeping in two localities. Dissection, measurements, and photographs were completed with the use of a stereo microscope with a digital camera attachment. Genitalia were prepared following techniques found in Oman (1949) and Young and Beirne (1958) . Photographs were processed with Helicon Focus photo-stacking software and post-processed using the 5th generation of the standard image-editing software. Micrographs of the aedeagus were acquired using a JEOL JSM-6480 Scanning Electron Microscope.
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