Vega 3

The morphological structures of the prepared samples were captured using Scanning Electron Microscope (SEM) of TESCAN, VEGA 3 with Bruker Detecter, Zeck Republic. Transmission Electron Microscope (TEM) (Tecnai 20 G2 (FEI make), Netherlands, was used to analyze the surface morphology.
Small angle X-ray scattering experiments were conducted on Rigaku (Rigaku Smart Lab) using Cu Kα radiation, the power of X-ray source was operated at 50 mA and 40 kV and the d-spacing values were calculated by the formula d = 2π/q. For SAXs measurement, thin film of the respective polymer solution was dip coated on a glass plate and dried in glove box. The as dried thin films were then measured.

The morphology, size, distribution, zeta potential, and thickness of the NSs were characterized by STEM (Jeol JEM‐2100F), SEM (TESCAN VEGA3), AFM (SPM8 Bruker NanoScope 8), and Zetasizer particle size analysis (Malvern Instruments, Limited). In addition, an FT‐IR spectrometer (Thermo Scientific Nicolet IS50), XRD (Rigaku SmartLab 9 kW), and UV–vis spectroscopy (Agilent Cary 8454) were applied to verify the chemical characteristics and structure. The amount of Fe in NSs was quantified by inductively coupled plasma optical emission spectrometry (ICP‐OES, Agilent 710 Series). A NanoOrange Protein Quantitation Kit was used to quantify the amount of APP loaded on the NSs.