Leo 1530vp
The LEO 1530VP is a high-resolution scanning electron microscope (SEM) designed for advanced imaging and analysis. It features a field emission gun (FEG) electron source and a versatile imaging mode selection, providing high-quality images with a resolution down to 1 nm. The LEO 1530VP is capable of operating under high vacuum conditions and is suitable for a wide range of materials analysis applications.
Lab products found in correlation
32 protocols using leo 1530vp
Characterization of SPCE/Au NFs using SEM
Morphological Characterization of Drug Particles
Needle Diameter Measurement by SEM
Nanoscale Characterization of BSA/MWCNTs/GA Layer
Morphological Analysis of Miscanthus Pretreatment
Scanning Electron Microscopy Sample Preparation
Comprehensive Material Characterization Protocol
SEM Imaging of Material Samples
Microscopic Characterization of Deposit Patterns
Visualizing Cellulose Samples Using SEM
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