Samples of the powder products were characterized using a S4800 field emission scanning electron microscope (SEM) (Hitachi High Technologies America Inc., Gaithersburg, MD). The samples were dispersed in a minimum amount of water, and a drop was placed on carbon tape on an aluminum stub and allowed to dry in a desiccator. All samples were sputter-coated (K550X Sputter Coater, Quorum Technologies Ltd, West Sussex, UK) with gold prior to analysis. The samples were imaged at 5 kV with a working distance of 6 mm.
K550x sputter coater
Manufactured by Quorum Technologies
Sourced in United Kingdom
The K550X sputter coater is a laboratory equipment designed for the deposition of thin films onto substrate samples. It utilizes a sputtering process to coat the samples with a thin layer of material, such as metals or conductive oxides. The core function of the K550X is to provide a controlled environment and power source for the sputtering process, allowing for the precise application of thin films onto various types of samples.
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Lab products found in correlation
Vega 3 scanning electron microscope, by TESCAN (6 mentions)
S 4800 field, by Hitachi (1 mentions)
Polaron sc7640 sputter coater, by Quorum Technologies (1 mentions)
Evo ma10 scanning electron microscope, by Zeiss (1 mentions)
S 4800, by Hitachi (1 mentions)
Sigma fesem, by Zeiss (1 mentions)
S 4800 scanning electron microscope, by Hitachi (1 mentions)
Ls 13 320 xr, by Beckman Coulter (1 mentions)
Acetone, by Merck Group (1 mentions)
Phenom scanning electron microscope, by Thermo Fisher Scientific (1 mentions)
Sem inspect f50, by Thermo Fisher Scientific (1 mentions)
Leo 912ab, by Zeiss (1 mentions)
18 protocols using k550x sputter coater
1
Scanning Electron Microscopy of Powder Samples
2
Characterization of Chemobrionic Composite Microstructure
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Growth halted structures were collected on a glass slide, gently washed with H2O and excess liquid removed using a pipette before drying in air at 60 °C for 12 h. Sections of the chemobrionic composite were embedded in EpoFix cold-setting embedding resin (Struers, UK) using a CitoVac vacuum embedding instrument (Struers, UK). To obtain horizontal and vertical cross-sections of the chemobrionic composite, embedded sections were abraded along respective planes, with progressively finer grit discs from FEPA P grade 120 to 4000 using a TechPrep grinder/polisher (Allied High Tech Products, USA). Prior to imaging, specimens were mounted onto aluminium stubs using double-sided carbon discs before being gold coated in argon atmosphere with the sputter current at 20 mA and coating time of 20 s using a K550X sputter coater (Quorum Technologies, UK). Embedded samples required the use of copper tape to ensure conductivity between the sample surface and the aluminium stub. SEM images and EDX elemental maps were acquired using a table-top TM 3030 Plus electron microscope coupled with an EDX detector operating with an electron acceleration voltage of 10–15 kV (Hitachi, Japan).
3
Scanning Electron Microscopy Preparation Protocol
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For Figures 4(a)–(d) and 7(a)–(c) , specimens were placed upon aluminium stubs using double-sided sticky carbon discs. Specimens were then gold sputter coated using a K550X sputter coater (Quorum Technologies, UK). Scanning electron microscopy (SEM) images were then acquired using an EVO MA 10 scanning electron microscope (Carl Zeiss AG, Germany). For Figure 7(d)–(f) , specimen test pieces were placed in liquid nitrogen to allow for cryogenic fracture in order to image a cross-sectional surface. Upon the underside of each specimen, a small amount of silver Acheson Silver DAG was applied in order to reduce charging. Double-sided sticky carbon discs and adhesive were used to secure specimens firmly to aluminium stubs. Specimens were then gold sputter coated using a Polaron SC7640 sputter coater (Quorum Technologies, UK). SEM images were then acquired using a 6060 scanning electron microscope (JOEL, USA).
4
Scanning Electron Microscopy of Candida albicans
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Candida albicans yeast cells from the control culture and those incubated with AAF with a protein concentration of 100 µg mL−1 were fixed with a glutaraldehyde solution at pH 7. The cells were then rinsed with sodium phosphate buffer at pH 7, flooded with a 1.5% OsO4 solution, and incubated at room temperature for 30 min. Next, they were treated with acetone solutions with increasing concentrations of 30, 50, 70, and 100% to dehydrate. The cell suspensions in acetone were spotted on SEM tables and dried in the presence of silica gel beads for 24 h at room temperature. The samples were then sputtered with gold using a K550X sputter coater (Quorum Technologies). The C. albicans cells were imaged using a Vega 3 scanning electron microscope (Tescan) with a 30 kV electron beam voltage.
5
Scanning Electron Microscopy of Fungal Cells
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The standard SEM procedure involved fixation of the fungal cells with 4% glutaraldehyde in 0.1 M phosphate buffer, pH 7.0, treatment with OsO4, and dehydration in a graded acetone series (in 15%, 30%, 50%, 70%, and 100% for 30 min for each concentration, at 3000 rpm). The preparations were dried in a desiccator using silica gel beads for 24 hours and then gold sputtered using a K550X sputter coater (Quorum Technologies). A Vega 3 scanning electron microscope (Tescan) was used for examination of the samples.
The AAF structure was observed and documented using a scanning electron microscope Quanta 3D FEG. The lyophilized preparation of the AAF was used for the observation. It was not subjected to standard dehydration and gold sputtering, which allowed visualization of its morphology in the most natural shape.
The AAF structure was observed and documented using a scanning electron microscope Quanta 3D FEG. The lyophilized preparation of the AAF was used for the observation. It was not subjected to standard dehydration and gold sputtering, which allowed visualization of its morphology in the most natural shape.
6
Visualizing Formulation Morphology via SEM
7
Fracture Surface Analysis of PEEK/CS Composites
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Secondary electron scanning electron microscopy (SEM) images of the fracture surfaces were obtained using a Sigma FE-SEM (Zeiss, Germany) operating at 15 kV under vacuum. PEEK/CS specimens with fracture surface exposed were secured firmly upon double adhesive carbon tapes attached to aluminium stubs before and gold coated under vacuum for 2 min using a K550X sputter coater (Quorum Technologies, UK) before images were acquired.
8
Microscopic Analysis of Liquid and Lyophilized Nanoemulsions
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Both the liquid and lyophilized NE formulations were imaged with an S-4800 Scanning Electron Microscope (Hitachi High Technologies America Inc., Gaithersburg, MD, USA). The liquid NE formulations were diluted 50% and stained with 2.5% phosphotungstic acid for 3 min at room temperature. A drop of the negatively-stained NE was added to a formvar-coated copper grid mounted on a dark field stage. The samples were imaged in scanning transmission electron microscopy (STEM) mode at an accelerating voltage of 30 kV. The lyophilized NE formulations were imaged both as a dry powder and after reconstitution with deionized water. The dry NE samples were mounted on aluminum stubs with carbon tape, then sputter-coated (K550X Sputter Coater, Quorum Technologies Ltd., West Sussex, UK) with gold at 2.0 mA for 1 min. The reconstituted lyophilized NE samples were prepared by the same staining procedure as the liquid NE formulations.
9
Particle Size Analysis of Budesonide Crystals
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The BUD particle size (volume-based diameter, dv) was determined for 10 mL samples of each drug using the laser diffraction particle analyzer LS 13 320 XR (Beckman Coulter Inc., Brea, CA, USA; range: 0.01–3500 μm) equipped with the Universal Liquid Module. The measurements were performed in two variants: in the raw samples and in the samples after sonication by sonotrode of the analyzer. Each measurement was performed in triplicate and the results were averaged.
Crystal size and morphology were also observed at 10,000× magnification with the scanning electron microscope (SEM-Hitachi TM1000, Tokyo, Japan). A washing procedure was required before the observations to remove all soluble additives which otherwise would crystallize on the particles after water evaporation. Pure BUD crystals were obtained by repeated centrifugation (3 min at 10,000 rpm) and washing with MilliQ water, and finally followed by drying in filtered air under atmospheric pressure. Before the observations, dried crystals were coated with a 25 nm layer of gold with the K-550X sputter coater (Quorum Technologies, Lewes, UK) for improving SEM pictures’ quality.
Crystal size and morphology were also observed at 10,000× magnification with the scanning electron microscope (SEM-Hitachi TM1000, Tokyo, Japan). A washing procedure was required before the observations to remove all soluble additives which otherwise would crystallize on the particles after water evaporation. Pure BUD crystals were obtained by repeated centrifugation (3 min at 10,000 rpm) and washing with MilliQ water, and finally followed by drying in filtered air under atmospheric pressure. Before the observations, dried crystals were coated with a 25 nm layer of gold with the K-550X sputter coater (Quorum Technologies, Lewes, UK) for improving SEM pictures’ quality.
10
Phibilin's Antifungal Effects on Candida albicans
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Candida albicans AY93025 cells (approximately 106–107 CFU/ml) at the exponential phase were incubated with 1 × MIC, 2 × MIC, or 4 × MIC of Phibilin for 30 min at 35°C. Saline was used as the negative control. After centrifugation, the cells were rinsed with saline, fixed for 1 h with 2.5% glutaraldehyde in PBS, dehydrated with increasing concentrations of ethanol (30, 50, 70, 90, and 100%), and air-dried at room temperature. The dry samples were then gold-coated using a K550X sputter coater (Quorum Technologies, United Kingdom) and then observed with an SEM (JSM-6390LV, Japan).
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