acoustic AC (AAC) mode AFM using a Pico plus 5500 inverted light microscope
atomic force microscope (ILM AFM) (Agilent Technologies) with a piezoscanner
having a maximum range of 9 μm. Microfabricated silicon cantilevers
of 225 μm length with a nominal spring force constant of 21–98
N/m were used from Nano sensors. The cantilever oscillation frequency
was tuned into the resonance frequency (150–300 kHz). The images
(256 by 256 pixels) were captured with a scan size ranging between
0.8 and 9 μm at the scan speed rate of 1 lines/S. The images
were processed using PicoView 1.12 software (Agilent Technologies).