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Pico plus 5500

Manufactured by Agilent Technologies

The Pico plus 5500 is a compact and versatile lab equipment product offered by Agilent Technologies. It is designed to provide accurate and reliable measurements in various laboratory settings. The core function of the Pico plus 5500 is to perform precise data acquisition and analysis.

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2 protocols using pico plus 5500

1

Atomic Force Microscopy Imaging Protocol

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Imaging was done with
acoustic AC (AAC) mode AFM using a Pico plus 5500 inverted light microscope
atomic force microscope (ILM AFM) (Agilent Technologies) with a piezoscanner
having a maximum range of 9 μm. Microfabricated silicon cantilevers
of 225 μm length with a nominal spring force constant of 21–98
N/m were used from Nano sensors. The cantilever oscillation frequency
was tuned into the resonance frequency (150–300 kHz). The images
(256 by 256 pixels) were captured with a scan size ranging between
0.8 and 9 μm at the scan speed rate of 1 lines/S. The images
were processed using PicoView 1.12 software (Agilent Technologies).
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2

Comprehensive Spectroscopic Characterization

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1H NMR (300 MHz) spectra were measured on Bruker DRX-300 spectrometer using TMS as the internal standard. Elemental analysis was conducted at the Elemental Analysis Center, Kyushu University. Atomic force microscopy (AFM, tapping mode) was carried out using an Agilent PicoPlus 5500. UV-vis absorption spectra were recorded on a JASCO V-670 spectrophotometer. Luminescence spectra were measured by using a PerkinElmer LS 55 fluorescence spectrometer. The samples were excited with an incidence angle of 45° to the quartz cell surface and the fluorescence was detected along the normal. The absolute quantum yields were calculated using a Hamamatsu C9920-02G instrument. Time-resolved photoluminescence lifetime measurements were carried out by using time-correlated single photon counting lifetime spectroscopy system, HAMAMATSU Quantaurus-Tau C11367-02 (for fluorescence lifetime)/C11567-01(for delayed luminescence lifetime). The quality of the fit has been judged by the fitting parameters such as χ2 (<1.2) as well as the visual inspection of the residuals. The upconversion luminescence emission spectra were recorded on Otsuka Electronics MCPD-7000 instrument with the excitation source using an external, adjustable 532 nm semiconductor laser.
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