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9 protocols using s 4700

1

Characterization of Nanostructured Materials

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Electron spectroscopy for chemical analysis (ESCA) measurements were performed using an Omicron ESCA probe (Omicron Nanotechnology). X-ray powder diffraction studies were carried out using a Rigaku instrument with Cu Kα radiation (1.5406 Å) over the 2θ range of 10–90° @ a scanning rate of 2° m−1. FTIR measurements were performed from 400 to 4000 cm−1 using a Bruker Tensor 37, and Raman measurements were performed over 200 to 3500 cm−1 using a LABRAM HR 800 (@ λ ∼ 533 nm). Nanostructure imaging was carried out by field emission scanning microscopy (FSEM, S-4700), high resolution transmission electron microscopy (HRTEM, JEOL-2100F) and energy dispersive X-ray (EDAX) elemental mapping. ESR measurements were performed at 9.4 GHz (X-band) with a microwave input of 950 μW.
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2

Exosome and Vesicle Characterization by SEM

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Pellets containing extracellular vesicles isolated from healthy cells (i.e., exosomes) and from apoptotic and necrotic cells were vortexed and resuspended in 0.2-1 ml DPBS. Exosomes and nano-scaled apoptotic vesicles or necrotic bodies (microscaled parts of apoptotic vesicles or necrotic bodies were removed prior to ultracentrifugation) were fixed in a 2% EMS-quality paraformaldehyde aqueous solution. The samples were then diluted in distilled (dl) water in serial dilutions, added in 1-5 μl vesicle mixtures to cleaned silicon chips, which were sonicated in acetone, ethanol and distilled water for 5 min in each solvent, flushed by water and blown dry, and immobilized after drying vesicles under a ventilation hood. Samples on silicon chips were mounted on a SEM stage by carbon paste. To make surface conductive, a coating of 2-5 nm gold-palladium alloy was applied by sputtering (SPI-Module Sputtering, Argon as gas for plasma) before imaging by scanning electron microscopy Hitachi S-4700 or a JEOL JSM-7600F SEM. SEM was performed under low beam energies (5.0-10.0 kV). For best vesicle morphology under SEM, fresh isolated exosomes were fixed and immobilized on silicon right after isolation, and imaged within 7 days. Analysis of exosome sizes were done using the SEM images via ImageJ and the density distribution of exosome diameters were obtained using R/Bioconductor.
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3

Characterization of Silver Nanoparticles

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Silver nanopowder, with a particle size less than 100 nm and a 99.9% trace metals basis, was purchased from Sigma-Aldrich (St. Louis, MO, USA). According to the supplier, the prepared AgNPs is characterized using transmission electron microscopy (TEM), dynamic light scattering (DLS), Zeta potential measurements, and UV/Visible spectral analysis to guarantee consistent materials (monodisperse AgNPs free from agglomeration; refractive index n20/D 1.333; fluorescence—λem 388 nm) (http://www.sigmaaldrich.com/materials-science/nanomaterials/silver-nanoparticles.html). For an additional characterization of the size distribution of the particles, scanning electron microscope (SEM) was performed. Briefly, the AgNPs was dissolved in 0.5% aqueous carboxymethylcellulose (Sigma-Aldrich) and the prepared solution was then coated with carbon, mounted on an electron microscope grid (200 mesh), and visualized using a scanning electron microscope (SEM; type S-4700, JEOL Ltd., Tokyo, Japan) operating at 80kV. However, AgNPs in the injected doses should be distributed more uniformly by sonication for 10 minutes just before injection, to be taken by systemic circulation.10 (link)
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4

Comprehensive Nanomaterial Characterization

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The prepared NPs were analysed in terms of their morphological, chemical and topographical properties. The morphological observations of the prepared nanopowders were made by FE-SEM (Hitachi S-4700, Japan) and TEM (JEOL JEM JSM 2010, Japan). Apart from these characterizations, AFM was also utilized to check the surface topographical behaviour (horizontal, vertical and lateral size of grown NPs). For AFM (Veeco, USA) observations, the sample was prepared on the silicon substrate by dropping an liquid dispersion of NPs and dried at room temperature for about 30 min. The crystallinity, phases and size of the prepared powder was characterized by XRD with Cu radiation (λ = 1.54178 Å, Rigaku, Japan) in the range of 20–80° with a 6° min−1 scanning speed with 40 kV and 30 mA current. Fourier transform infrared spectroscopy (FTIR, PerkinElmer GX spectrophoto meter) measurements were analysed in the range 4000–400 cm−1.
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5

Surface Roughness and Topography Analysis

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The average surface roughness (Ra) and surface topography were measured using a confocal laser microscope (Carl Zeiss, Oberkochen, Germany). Surface morphology of specimens was observed using a scanning electron microscope (HITACHI S-4700 and JEOL, Tokyo, Japan) after sputter coating with platinum (Pt).
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6

Characterization of Filler Dispersion in Polymer Composites

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Scanning Electron Microscope (SEM) micrographs of the dispersion of fillers in the polymer matrix were obtained via the Hitachi S‐4700 and JEOL scanning electron microscope (JED‐2300). The measurements were conducted on the uniaxial tension mode using mechanical tester MTS C42 with a loading speed of 20 mm min−1, following ASTM D638. The size of the samples was prepared according to ASTM D638 type V. The electrical conductivities were measured using a standard four‐probe station (HPS2524). The Uniaxially cyclic tests were conducted with 40% strain at 20 mm min−1 tensile rates via the Mark‐10 ESM303 Motorized Test Stand. The experimental result of resistance was recorded via a data acquisition system (including a DAQ6510 data acquisition system and KickStart Instrument Control Software). The relative change in resistance was defined as ΔR/R0, where R0 and ΔR are the electrical resistance of the electrode without and with deformation, respectively. Atomic force microscope (AFM) images were recorded on NX10 AFM. The Data physics OCA15EC (Data Physics Instruments GmbH) detected the static contact angle. All of the tests were performed at room temperature.
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7

Comprehensive Material Characterization

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The morphology and microstructure of these samples were characterized using scanning electron microscopy (SEM, JEOL Hitachi S-4700, Japan) and high-resolution transmission electron microscopy (HRTEM, JEOL JEM200CX, JEOL). Powder X-ray diffraction (XRD, Bruker D8 Advance diffractometer with Cu-Kα radiation) experiments were performed to study the crystallographic information of the samples. X-ray photoelectron spectroscopy (XPS, Thermo Fisher Scientific, USA) was performed using an ESCALab MKII spectrometer with Al Kα (1.4866 keV) as the X-ray source. The specific Brunauer–Emmett–Teller (BET) surface areas of the hydrogels were measured by analyzing the nitrogen adsorption and desorption isotherms at −196 °C, obtained using a Micromeritics Model ASAP 2020 sorptometer.
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8

Comprehensive Characterization of Energy Materials

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Microstructures of MSO, NMOH, and electrode were analyzed using transmission electron microscopy (TEM, JEOL JEM-1011), scanning electron microscopy (SEM, Hitachi S4700), and high-resolution TEM (HRTEM, JEOL JEM-3010). Crystal structures of active materials were investigated with a Rigaku D/Max 2500 X-ray diffractometer (XRD) using a Cu Kα radiation. Compositions of the NMOH were measured by a Thermo VG RSCAKAB 250 high-resolution X-ray photoelectron spectroscopy (XPS). Thermal stability of NMOH was carried out on a TA Q50 thermogravimetric analyzer (TGA) at a heating speed of 10 °C min−1 under an argon atmosphere. Specific surface area was measured based on N2 adsorption/desorption isotherms with a JW-BK132F (JWGB SCI & TECH) analyzer. Inductively coupled plasma atomic emission spectroscopy (ICP-AES) was performed on ICAP6300 Radial. For the ex situ XRD measurements, the cathodes obtained at specific voltages were washed thoroughly with distilled water and ethanol and these electrodes were then dried at 60 °C for 10 h in vacuum.
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9

Characterization of Nanomaterial Samples

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Samples were characterized using X-ray diffraction (XRD; Rigaku, RINT-Ultima III), UV-vis diffuse reflectance spectroscopy (DRS; JASCO, V-670DS), field-emission scanning electron microscopy (FE-SEM; Hitachi, S-4700, and JEOL, JSM-7001F) and field-emission transmission electron microscopy (FE-TEM; JEOL, JEM-2800). The DRS reflectance (R) data were converted to the Kubelka-Munk function using the equation f(R) = (1-R)2/(2 R). The relative weight (WR) of each specimen was determined from the equation WR = (WaW0)/(WbW0), where Wa, Wb, and W0 are the total weight of the powder and the alumina boat after nitridation, the total weight of the powder and alumina boat before nitridation, and the weight of the alumina boat, respectively. Elemental analysis was performed using inductively coupled plasma atomic emission spectroscopy (ICP-AES; Shimadzu, ICPS-8100) and oxygen/nitrogen combustion analysis (ON analysis; Horiba, EMGA-620W/C). Nitrogen adsorption isotherms for the samples were acquired at 77 K with a BELSORP-mini instrument (MicrotracBEL). The relative surface areas of the samples were determined using the Brunauer-Emmett-Teller (BET) model.
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