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Miniflex600 c

Manufactured by Rigaku
Sourced in Japan

The MiniFlex600-C is a compact, benchtop X-ray diffractometer designed for phase identification and quantification of crystalline materials. It features a 600W X-ray generator and a sealed X-ray tube, providing reliable and stable performance. The instrument is capable of analyzing a wide range of samples, including powders, thin films, and small solid objects.

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3 protocols using miniflex600 c

1

Characterization of ZnO Nanoparticles

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The particle yield Y was defined as follows. where Wcollect is the weight of products after washing and drying and Wtheory is regarded as the weight of ZnO when anhydrous Zn(acac)2 (263 g mol−1) is completely converted to ZnO. The products were analyzed by X-ray diffractometry (XRD) (MiniFlex600-C; Rigaku Corp.) using Cu Kα radiation and by a Fourier transform infrared spectrometer (FT-IR) (FT-IR4100; JASCO Co., Ltd). The products were observed by transmission electron microscopy (TEM) (H-7650; Hitachi Corp.) operated at 100 kV. Thermogravimetric (TG) analysis was performed under N2 atmosphere using a thermogravimetric analyzer (TGA-50; Shimadzu Corp.). The temperature was increased to 600 °C at a ramp rate of 10 °C min−1. Thermogravimetric mass analysis (TG-MS) was performed from room temperature to 500 °C at a ramp rate of 10 °C min−1 under He atmosphere using a Thermo plus EVO2 Thermo Mass Photo (Rigaku Corp.). When comparing the relative intensities in each m/z value, the background spectra at 30 °C was subtracted from original mass spectra to eliminate any background noise.
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2

Synthesis and Characterization of Silver Nanoparticles from Teucrium stocksianum

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In the current study, washed and oven-dried glassware was used. Deionized water was used for the preparation of all solutions. AgNO3 (99.98%) from Merck, Darmstadt, Germany was used for the preparation of SNPs. UV–Vis analyses were performed on a UV-1700 spectrophotometer (Shimadzu, Koyoto, Japan). FT-IR spectra were recorded on IR Prestige-21 Perkin Elmer Nicolet 510P (Shimadzu, Koyoto, Japan). Scanning electron microscopy was performed on a scanning electron JEOL IT100LA (JEOL, Tokyo, Japan) for surface morphology, distribution, and size of NPS. Dynamic light scattering (DLS) was performed on Malvern zetasizerNanoZS, Worcestershire UK to determine particle size distribution and zeta potential. Powder X-ray diffraction measurements were carried out (over a range of 5–100°, 2ϴ) on Rigaku MiniFlex 600c, Tokyo, Japan. The aerial part of Teucrium stocksianum was collected from Makerwal, Mianwali, Pakistan.
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3

Synthesis and Characterization of Iron Oxide Nanoparticles

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The particle yield Y was defined as follows. where Wcollect is the weight of final products after washing and drying and Wtheory is the maximum particle weight of Fe2O3 when the reaction is complete. X-ray diffraction patterns of the products were obtained via X-ray diffraction (XRD) (MiniFlex600-C; Rigaku Corp.) using Cu Kα radiation. The crystallite size was evaluated using the Scherrer equation, where 0.90 of shape factor was used. The products were observed by transmission electron microscopy (TEM) (H-7650; Hitachi Corp.) operated at 100 kV. High resolution TEM (HR-TEM) images and electron diffraction pattern of particle colony were acquired using a JEOL JEM-2010F electron microscope operated at 200 kV. The solid products for TEM and HR-TEM analysis were dispersed in cyclohexane before transferred onto the copper grids with a organic membrane. The mean size, with their standard deviation, of the particles was determined by observing approximately 200 particles for TEM analysis. Thermogravimetric analysis was performed from room temperature to 600 °C at a ramp rate of 10 °C min−1 and at N2 atmosphere using a thermogravimetric analyzer (TGA) (TGA-50; Shimadzu Corp.). The absorbed state of an organic surfactant on the iron oxide surface was investigated using a Fourier transform infrared spectrometer (FT-IR) (FT-IR4100; JASCO Co., Ltd.).
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