Jfd 320
The JFD-320 is a field emission scanning electron microscope (FE-SEM) designed for high-resolution imaging of a wide range of materials. It features a high-brightness electron gun and advanced optics to deliver exceptional image quality and resolution. The JFD-320 is capable of operating at accelerating voltages between 0.5 and 30 kV, allowing for versatile imaging applications.
Lab products found in correlation
25 protocols using jfd 320
SEM Imaging of Cultured Human Corneal Endothelial Cells
Scanning Electron Microscopy of Testicular Cells
Specimen Preparation and Morphological Analysis of Wasps
The external structures of dry-mounted wasps were examined using binocular stereomicroscopes (S8APO and MZ APO, Leica Microsystems KK, Tokyo, Japan) fitted with digital single-lens reflex cameras (E-30, Olympus, Tokyo, Japan) and a scanning electron microscope (JSM-6380LV, JEOL, Tokyo, Japan) operating at 1.5 kV. The length of each body part was measured using an ocular micrometer.
The following morphological abbreviations were used: POL, postocellar line (the distance between the inner edges of the two lateral ocelli); OOL, ocular-ocellar line (the distance from the outer edge of a lateral ocellus to the compound eye); and LOL, lateral-ocellar line (the distance between the median and lateral ocelli). The morphological terminology follows Richards (1977) , Ronquist and Nordlander (1989) , and Liljeblad et al. (2008) ; the description of surface sculptures follows Harris (1979) .
Morphological Characterization of Fungal Cells
Root Tip Imaging via SEM
Analyzing Gardnerella Biofilm Formation
Electron Microscopy Sample Preparation
Morphological Analysis of Flag Leaf
Scanning Electron Microscopy of Dehydrated PMCs
The dried specimens of both types were fixed on aluminium disks by means of a current-conducting tape and coated with gold using a vacuum sputtering equipment JFC-1100 (JEOL, Japan) for better resolution. The specimens were examined in a JSM-6510LV scanning electron microscope (JEOL, Japan).
Specimen Preparation for SEM Imaging
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