The characterizations of CoO NWs and CoS 2x Se 2(1-x) NWs were carried out by field emission scanning electron microscopy (FESEM, Hitach S-4800), transmission electron microscopy (TecnaiF20), X-ray diffraction (XRD) (Philips X'Pert Pro Super) on an X-ray powder diffractometer with Cu Kα radiation (λ = 1.5418 Å) and X-ray photoelectron spectroscopy (ESCALAB250Xi).
Tecnai f20
Manufactured by Philips
Sourced in Netherlands, United States
The Tecnai F20 is a high-performance transmission electron microscope (TEM) designed for advanced materials research and analysis. It features a field emission electron source, high-resolution imaging capabilities, and advanced analytical tools, making it a versatile and powerful tool for characterizing a wide range of materials at the nanoscale.
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Lab products found in correlation
D max 2500, by Rigaku (4 mentions)
Whatman, by Cytiva (2 mentions)
Ft ir 4100, by Jasco (2 mentions)
Zetasizer nano z, by Malvern Panalytical (2 mentions)
S 4700, by Hitachi (2 mentions)
Asap 2020, by Micromeritics (2 mentions)
X pert pro super, by Philips (1 mentions)
Leo supra 55, by Zeiss (1 mentions)
Tecnai f30, by Thermo Fisher Scientific (1 mentions)
K alpha, by Thermo Fisher Scientific (1 mentions)
Quant it ribogreen rna assay kit, by Thermo Fisher Scientific (1 mentions)
Malvern zetasizer nano z, by Malvern Panalytical (1 mentions)
Ultrascan 4000, by Ametek (1 mentions)
Formvar carbon coated copper grid, by Ted Pella (1 mentions)
Tristar 2 3020, by Micromeritics (1 mentions)
S 4800, by Hitachi (1 mentions)
Multilab 2000, by Thermo Fisher Scientific (1 mentions)
Cary 5000, by Agilent Technologies (1 mentions)
Zetasizer nano series nano zs, by Malvern Panalytical (1 mentions)
Whatman filter paper, by Cytiva (1 mentions)
36 protocols using tecnai f20
1
Comprehensive Characterization of Co-based Nanostructures
2
Characterization of Grown Zinc Telluride Nanowires
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Initial evaluation of
the grown nanowires was done under an optical microscope (Olympus
BX-51). Detailed examination of the grown nanowires and of the fabricated
devices was done using field-emission scanning electron microscope
(SEM, LEO Supra 55 VP Zeiss) at a low working voltage of 3–4
kV. Thin cross-section lamellas were prepared using focused-ion beam
(FIB, FEI Helios DualBeam). High-resolution TEM (HRTEM, FEI Tecnai
F-30) was used at a working voltage of 300 kV to acquire detailed
information regarding the dimensions, morphology, and crystal structure
of the nanowires. To determine the crystallographic orientation of
the guided nanowires, and calculate their epitaxial relations with
the sapphire substrates, the HRTEM images were analyzed using Fourier
transform (FFT) from selected areas in the nanowires cross-section
and according to crystallographic tables for bulk ZnTe. The longitudinal
and transversal mismatch between the nanowires and the substrate were
calculated usingeq 1 . An energy-dispersive X-ray
spectroscopy (EDS)
detector installed within a transmission electron microscope (TEM,
Philips Tecnai F-20) was used at a working voltage of 300 kV for elemental
characterization of the nanowires. Energy-filtered TEM (EFTEM, Philips
Tecnai F-20) was used for elemental mapping.
the grown nanowires was done under an optical microscope (Olympus
BX-51). Detailed examination of the grown nanowires and of the fabricated
devices was done using field-emission scanning electron microscope
(SEM, LEO Supra 55 VP Zeiss) at a low working voltage of 3–4
kV. Thin cross-section lamellas were prepared using focused-ion beam
(FIB, FEI Helios DualBeam). High-resolution TEM (HRTEM, FEI Tecnai
F-30) was used at a working voltage of 300 kV to acquire detailed
information regarding the dimensions, morphology, and crystal structure
of the nanowires. To determine the crystallographic orientation of
the guided nanowires, and calculate their epitaxial relations with
the sapphire substrates, the HRTEM images were analyzed using Fourier
transform (FFT) from selected areas in the nanowires cross-section
and according to crystallographic tables for bulk ZnTe. The longitudinal
and transversal mismatch between the nanowires and the substrate were
calculated using
spectroscopy (EDS)
detector installed within a transmission electron microscope (TEM,
Philips Tecnai F-20) was used at a working voltage of 300 kV for elemental
characterization of the nanowires. Energy-filtered TEM (EFTEM, Philips
Tecnai F-20) was used for elemental mapping.
3
Bacterial Cell Flagellum Length Measurement
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Formvar‐coated grids were floated on 20‐μl drops of a bacterial cell suspension (Mantri et al., 2015 ). Excess sample was withdrawn by touching the edge of the grid to the cut edge of Whatman filter paper. The grids were negatively stained with a 1% solution of phosphotungstic acid and observed using a Tecnai F20 transmission electron microscope (Philips, Holland). More than 20 fields of view were randomly selected for each group. The flagellum lengths were measured from the images (n = 6 cells per condition) using Osiris 4.0 software (Geneva, Switzerland).
4
Comprehensive Physicochemical Characterization of SnAC–Fe3O4 Nanocomposites
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The samples' X-ray diffraction (XRD) patterns were acquired with a RIGAKU, D/MAX-2500 powder diffractometer equipped with a Cu Kα radiation source (λ = 1.541 Å) operating at 40 kV and 300 mA. The structure and surface characteristics of the samples were investigated under transmission electron microscopy (TEM, 200 kV, Tecnai F20, Philips) and scanning electron microscopy (SEM-4700) equipped with an energy-dispersive X-ray spectrometer (EDX). The morphological analysis results, chemical compositions and binding energies were confirmed by Fourier transform infrared spectrophotometry (FT-IR, 4100, Jasco, Japan) and X-ray photoelectron spectroscopy (XPS, K-alpha, Thermo VG Scientific). Fourier-transform infrared spectrophotometry (FT-IR, 4100, Jasco, Japan) was utilized to examine the vibration peaks of the SnAC–Fe3O4 nanocomposites before and after the annealing process. The Brunauer–Emmett–Teller (BET) surface area and average pore diameter were obtained from N2 adsorption/desorption isotherms using a fully automatic physisorption analyzer (ASAP 2020, Tristar). Also, the zeta potentials of the SnAC sample, Fe3O4 NPs, and SnAC–Fe3O4 nanocomposites were obtained by dynamic laser-light scattering (DLS, Zeta PALS).
5
Soot Characterization via HRTEM
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Soot morphology and nanostructure are originate from the TEM images that are collected using a HRTEM (high-resolution transmission electron microscope), Philips Tecnai F20, by 0.248 nm point resolutions at 200 kV. A MBSM (momentum-based sampling method) is introduced to collect soot sample before using TEM equipment. Exhaust gases, which come from exhaust pipeline in CI engines, are forced to the TEM grids using a vacuum pump. PM samples subside on high TEM grids. Afterwards, the soot samples are uninterruptedly flushed by dichloromethane solvent, and obtain the experimental samples. Same processes of fringe analysis and digitization of TEM images are referred from paper of previous studies [29] , [36] .
6
Characterization of RBD mRNA-LNP Formulation
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The particle size distribution, polydispersity index (PDI) value and zeta potential of RBD mRNA-LNP was analyzed by Dynamic Light Scattering (DLS, Zetasizer Nano ZS, Malvern Panalytical ltd., Malvern, WR, UK). The sample was diluted 100-fold and equilibrated for 120 s at 25 °C prior to size and zeta potential measurements. The hydrodynamic diameter (z-average) and zeta potential of RBD mRNA-LNP was analyzed by Zetasizer software, version 7.11 (https://www.malvern.com ). The morphology of RBD mRNA-LNP in a dry state was observed using cryogenic transmission electron microscopy (cryo-TEM, Tecnai F20, Philips, Eindhoven, the Netherlands). Briefly, the sample solution was diluted 10-fold and transferred onto 300-mesh copper grids covered with porous carbon film (HC300-Cu, PELCO) for blotting and plunging in a 100% humidity temperature-controlled chamber using a Vitroblot system (FEI). The copper grids were stored in liquid nitrogen and transferred to the electron microscope on a cryo-stage for imaging. The mRNA encapsulation efficiency (EE%) and concentration was determined with a Quant-iT RiboGreen RNA assay kit (Invitroge, Thermo Fisher Scientific, Waltham, MA, USA). The agarose gel retardation assay was performed to analyze the size and integrity of bound/unbound mRNA. The bound/unbound mRNA in LNP nanoparticles was analyzed in the presence and absence of 1% Triton X-100.
7
Characterization of Liposome Nanoparticles
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The mean particle diameters of liposomes (LD, sLV, or LSRB) were measured by DLS at 25°C using a Malvern Zetasizer Nano ZS (Malvern Instruments, Worcestershire, United Kingdom) with a laser at a wavelength of 633 nm and a 90° scattering angle. The zeta-potential of the liposomes was determined using laser Doppler electrophoresis on a Malvern Zetasizer Nano ZS. Liposome structure was visualized with a cryo-TEM (Tecnai F20, Philips) operating at 200 kV. Specimens were plated on porous carbon film-covered 300-mesh copper grids (HC300-Cu, PELCO). The grids were blotted at 100% humidity and 4 °C for 3 s, and then rapidly frozen in liquid ethane cooled by liquid nitrogen using a Vitrobot (FEI). The grids were introduced into the high-vacuum of the electron microscope column. The low dose condition for each exposure was ∼20 e Å-2. The liposomes in the holes of the carbon film were observed under cryo-TEM using a 70 μm objective aperture. Images were acquired at 10 k or 50 k magnification and were recorded using a 4 k × 4 k CCD camera (Gatan UltraScan 4000).
8
CeO2 NPs Morphology Analysis
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The size and morphology of CeO2 NPs were examined using a transmission electron microscope (TEM). Briefly, a drop of CeO2 NPs suspension at 50 µg/mL was tested under a TEM (200 kV, Tecnai F20, Philips, The Netherlands).
9
Amyloid Fibril Imaging Protocol
10
Characterization of Electrode Materials
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Thermo-gravimetric analysis (TGA) was carried out using a thermogravimetric analyzer (Perkin Elmer TGA7) at a scan rate of 10 °C·min−1 in air atmosphere. The crystal structure of the annealed samples was characterized by X-ray diffraction (XRD, Rigaku DIII Ultima with Cu Kα radiation) with 2θ ranging from 10°–80°. Further, the microstructure of the as prepared free standing electrode and the electrodes after tests was observed using field-emission scanning electron microscopy (FE-SEM, S-4700 Hitachi) equipped with energy dispersive spectroscopy (EDS) and high–resolution transmission electron microscopy (HR-TEM, Philips Tecnai F20 at 200 kV). Raman analysis was also carried out using a Raman spectroscopy (Horiba Jobin Yvon HR800 with 744 nm initial excitation laser) (KBSI Gwangju-center).
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