Scanning electron microscopy (SEM) was performed on a Nova Nanosem 200 system with an acceleration voltage of 15 kV. Transmission electron microscopy (TEM) and high resolution transmission electron microscopy (HRTEM) were conducted on JEM-2100F. Energy dispersive X-ray energy spectrum (EDX) and TEM measurements were performed simultaneously. Raman spectroscopy (INVIA, Renishaw, United Kingdom) was carried out at an ambient temperature with a 514 nm laser excitation. X-ray photoelectron spectroscopy (XPS) was performed in the spectrometer from Kratos axis Ultradld, using Mono Al Ka radiation power of 120 W (8 mA, 15 kV). X-ray diffraction (XRD) was tested by using a Cu-Ka radiation (A = 0.15406 nm) on the Bruker D8 Advanced Diffractometer with a data acquisition range of 10°–80° and sweep rate of 0.02° s−1. Thermogravimetric analysis (TGA) was performed on Perkin-Elmer PRIS1 TGA/Clarus SQ 8T at a heating rate of 5°C min−1.
D8 advanced diffractometer
Manufactured by Bruker
Sourced in Germany, United States
The D8 Advanced Diffractometer is a laboratory instrument designed for X-ray diffraction analysis. It is capable of performing various diffraction techniques to characterize the structural properties of solid materials.
Automatically generated - may contain errors
Lab products found in correlation
S 4800, by Hitachi (5 mentions)
Jem 2100f, by JEOL (5 mentions)
Mira3 fe sem microscope, by TESCAN (3 mentions)
Eds detector, by Oxford Instruments (3 mentions)
Em10c 100 kv series microscope, by Zeiss (3 mentions)
Jem 2100, by JEOL (3 mentions)
Spectrum 100 ftir spectrometer, by PerkinElmer (3 mentions)
Dimethyl sulfoxide (dmso), by Xilong (3 mentions)
Tecnai g2 s twin, by Thermo Fisher Scientific (2 mentions)
U 3100 spectrophotometer, by Hitachi (2 mentions)
Ls 45 fluorescence spectrometer, by PerkinElmer (2 mentions)
Optima 7300dv icp oes analyzer, by PerkinElmer (2 mentions)
Jsm 7800f, by JEOL (2 mentions)
Nicolet nexus 670 ft ir, by Bruker (2 mentions)
S 4800 sem, by Hitachi (2 mentions)
Escalab 250xi, by Thermo Fisher Scientific (2 mentions)
Invia spectrometer, by Renishaw (1 mentions)
Escalab 250xi x ray photoelectron spectrometer, by Thermo Fisher Scientific (1 mentions)
Jsm 5610, by JEOL (1 mentions)
Jem 1200ex, by JEOL (1 mentions)
54 protocols using d8 advanced diffractometer
1
Multimodal Characterization of Nanomaterials
2
Characterization of HfS2-rGO and HfP-rGO Catalysts
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Crystals of the prepared HfS2-rGO NS and HfP-rGO NS catalysts were analyzed by powder X-ray diffraction (XRD) using a Bruker D8 advanced diffractometer with Cu Kα radiation (λ = 1.5418 Å). Raman spectra of HfS2-rGO NS and HfP-rGO NS were recorded using a Renishaw inVia spectrometer with 532 nm laser excitation. Morphologies of the HfS2-rGO NS and HfP-rGO NS catalysts were captured by scanning electron microscopy (SEM), and the elements in the catalysts were distinguished by elemental mapping techniques using a Hitachi (S-4800) SEM. The in-depth morphology of the prepared catalysts was further examined by transmission electron microscopy (TEM) and selected area electron diffraction tests using a Tecnai (20 U-TWIN) TEM. The elemental composition and the binding energies of the HfS2-rGO NS and HfP-rGO NS were detected using a Thermo Fisher Scientific ESCALAB 250Xi X-ray photoelectron spectrometer (XPS) with Al Kα radiation.
3
Structural Analysis of Materials by PXRD and SEM
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Powder X-ray
diffraction (PXRD) measurements were performed using a Bruker D8 advanced
diffractometer equipped with Cu Kα X-rays (1.5406 Å) and
a solid-state Si detector. Samples were mounted on a low-background
Si [1 1 1] disk sample holder. Powder XRD data were recorded from
2θ (10–90°) with a scanning rate of 0.010°/min.
Powder XRD patterns were quantified by Rietveld analysis using Topas
4.0 software37 and refined using appropriate
crystal structures using a powder diffraction file (PDF) available
from a crystallographic database (ICDD).
Scanning electron microscopy
(SEM) and energy-dispersive X-ray (EDX) measurements were performed
on JEOL model JSM-5610 equipment with secondary electron and backscattered
electron. Data were analyzed using INCA Microanalysis Suite software
v 4.15 and ImageJ v1.532.
diffraction (PXRD) measurements were performed using a Bruker D8 advanced
diffractometer equipped with Cu Kα X-rays (1.5406 Å) and
a solid-state Si detector. Samples were mounted on a low-background
Si [1 1 1] disk sample holder. Powder XRD data were recorded from
2θ (10–90°) with a scanning rate of 0.010°/min.
Powder XRD patterns were quantified by Rietveld analysis using Topas
4.0 software37 and refined using appropriate
crystal structures using a powder diffraction file (PDF) available
from a crystallographic database (ICDD).
Scanning electron microscopy
(SEM) and energy-dispersive X-ray (EDX) measurements were performed
on JEOL model JSM-5610 equipment with secondary electron and backscattered
electron. Data were analyzed using INCA Microanalysis Suite software
v 4.15 and ImageJ v1.532.
4
Characterization of Nanoscale Zero-Valent Iron
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The surface morphologies of nZVI were observed with a transmission electron microscope (TEM, JEM-1200EX, JEOL Ltd., Japan) and a scanning electron microscope (SEM, S-4800, Hitachi Company, Japan). The specific surface area of nZVI was determined by a BET (Brunauer–Emmett–Teller) surface analyzer (ASAP 2460, Micromeritics Corporation, USA). The X-ray diffraction (XRD, D8 Advanced Diffractometer, Bruker Corporation, Germany) analysis was performed with Cu/Kα radiation at 45 kV to determine the crystal structure of these particles. The surface structure and composition of nZVI were analyzed by X-ray photoelectron spectroscopy (XPS, ESCALAB 250Xi, Thermo Corporation, USA).
5
Morphological and Structural Characterization
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The morphology was characterized using a scanning electron microscope (SEM; JSM-6700F; JEOL, Tokyo, Japan) and a high-resolution transmission electron microscope (HR-TEM; JEOL JEM-2100). The specific surface area and pore-size distribution of the samples were analyzed following nitrogen-adsorption–desorption measurements (NOVA 4200e; Quantachrome, Boynton Beach, FL, USA). The crystalline structure of the samples was characterized with X-ray diffraction (XRD) recorded on a Bruker D8 advanced diffractometer (Billerica, MA, USA).
6
Comprehensive Characterization of Material Samples
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FTIR spectra were recorded
by a Bruker Alpha II spectrometer (4000–500 cm–1). A Bruker D8 advanced diffractometer using Cu Kα radiation
was used for phase identification. Samples were mounted on a flat
steel and scanned from 5 to 70°. A JEOL HRTEM-2100 electron microscope
was used to get HRTEM images and selected area electron diffraction
(SAED) patterns. SEM images were obtained by a ZEISS EVO LS 15 electron
microscope. A Perkin Elmer Lambda 25 spectrometer (200–700
nm) was used to record the absorption spectra. Emission spectra were
recorded using a Perkin Elmer LS 45 fluorescence spectrometer.
by a Bruker Alpha II spectrometer (4000–500 cm–1). A Bruker D8 advanced diffractometer using Cu Kα radiation
was used for phase identification. Samples were mounted on a flat
steel and scanned from 5 to 70°. A JEOL HRTEM-2100 electron microscope
was used to get HRTEM images and selected area electron diffraction
(SAED) patterns. SEM images were obtained by a ZEISS EVO LS 15 electron
microscope. A Perkin Elmer Lambda 25 spectrometer (200–700
nm) was used to record the absorption spectra. Emission spectra were
recorded using a Perkin Elmer LS 45 fluorescence spectrometer.
7
Structural and Optical Characterization of Nanocrystals
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X-ray diffraction (XRD) patterns were acquired with a Bruker D8 Advanced diffractometer equipped with a Cu tube (wavelength: = 1.5418 Å) and a fast LYNXEYE 1D-detector. NCs diffraction pattern were measured in the 10°–100° range (2θ) for phase identification, quantification, and structure refinement. Rietveld refinement was carried out to estimate the average crystallite size of the NCs as well as the lattice parameters.
Transmission electron microscopy (TEM) images were obtained to study both the morphology and particle size of the NCs using a JEOL JEM-1011 electron microscope equipped with a high-resolution CCD camera (Gatan).
RT optical spectroscopy of the NCs was studied, recording the excitation and emission spectra with a FLS920 spectrofluorometer from Edinburgh Inst. equipped with double monochromators in emission and excitation, a 450 W Xe lamp as a CW excitation source and an electrically cooled photomultiplier tube R928P (Hamamatsu) for detection. Emission lifetime measurements were performed with a 60 W pulsed Xe lamp.
Transmission electron microscopy (TEM) images were obtained to study both the morphology and particle size of the NCs using a JEOL JEM-1011 electron microscope equipped with a high-resolution CCD camera (Gatan).
RT optical spectroscopy of the NCs was studied, recording the excitation and emission spectra with a FLS920 spectrofluorometer from Edinburgh Inst. equipped with double monochromators in emission and excitation, a 450 W Xe lamp as a CW excitation source and an electrically cooled photomultiplier tube R928P (Hamamatsu) for detection. Emission lifetime measurements were performed with a 60 W pulsed Xe lamp.
8
Powder X-ray Diffraction Spectra Analysis
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Powder X-ray diffraction spectra were acquired with a Bruker D8 Advanced diffractometer equipped with a Ni filter and CuKα radiation at 40 kV and 40 mA. The measurement was made in the 2θ angular range from 3° to 90° with a 0.002° step scan and integration of at 2θ angles from 15 to 2° by 52 min.
9
Comprehensive Characterization of Coating Samples
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The functional group analysis of coating samples was characterized by Fourier transform infrared spectroscopy (FTIR) using a Nicolet 8600 FTIR spectrometer (Tamil Nadu, India). FTIR spectra were recorded from 400 to 4000 cm−1 with 4 cm−1 resolution, averaging 100 scans. The phase composition of the coatings was analyzed by X-ray diffraction (XRD) using a Bruker D8 Advanced diffractometer (Karlsruhe, Germany) with Cu-Kα radiation, 40 kV/40 mA, and λ = 1.5406 nm. The surface morphology of coating specimens was studied by field emission scanning electron microscopy (FESEM; Quanta 250 FEG, FEI Company, (Hillsboro, OR, USA) at 30 kV. Energy dispersive X-ray Analysis (X Flash Detector, 5030 Bruker Nano, Karlsruhe, Germany) examined the elemental compositions of all coated specimen. The elemental compositions of the present samples were determined by X-ray photoemission spectroscopy (XPS) with a VGS ESCALAB 210 instrument (Oakville, ON, Canada). The inner surface morphology of coatings was obtained by transmission electron microscopy (TEM; JEOL JEM2010, 200 Kv, Pleasanton, CA, USA) and HRTEM (JEM-2100F, Williamston, SC, USA).
10
Multimodal Characterization of Nanoparticles
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The X-ray diffraction date were collected in a D8 Advanced diffractometer (Bruker) using CuKα radiation (λ = 0.154 nm). Transmission electron microscopy measurements were carried out on a FEI Tecnai G2 S-Twin with a field emission gun operating at 200 kV. Dynamic light scattering (DLS) and surface zeta potential measurements were performed on a Malvern instrument Zatasizer Nano. N2 adsorption/desorption analysis was measured on a Micromeritics ASAP 2020M apparatus. The Brunauer-Emmett-Teller (BET) method was used to calculate the specific surface area of samples from the data between 0.05 and 0.35, and t-plot method was to calculate the pore volume. The UV-vis absorption spectra were obtained from U-3100 spectrophotometer (Hitachi). Fourier transform Infrared spectra (FT-IR) were obtained by a PerkinElmer 580BIR spectrophotometer using KBr pellets. The X-ray photoelectron spectra (XPS) were performed on an ECSALAB 250. The UC emission spectra were carried out from an F-7000 fluorescence spectrometer (Hitachi) using a 980 nm laser as the excitation source. The digital photos of up-converting luminescence were obtained from a Canon camera. CLSM images were acquired from a FV 1000 confocal laser scanning microscrope (Olympus). A flow cytometry was recorded on a FCM cytometer (BD Biosciences) using 488 nm as excitation wavelength.
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