Nicolet nexus 870 ftir spectrometer

The IR spectra of all films were recorded in dry state utilizing a Nicolet Nexus 870 FTIR spectrometer (ThermoFisher Scientific, USA) equipped with VariGATR attachment (Harrick Scientific Products, USA). The attachment comprises Ge hemispherical ATR crystal and allows measurement at AOI in the range of 60-65°. The measurement chamber was continuously purged with dry air. The reported GAATR-FTIR spectra are averages of 256 scans taken with resolution of 2 cm⁻¹. The acquisition time was about 3 min. All reported GAATR-FTIR spectra present the absorbance. The reference spectra were recorded on freshly cleaned silicon sample.

SEM was performed on a JSM‐7800F and TEAM Octane Plus and TEM was conducted on a JEM‐2100 and X‐Max80. Raman spectroscopy was analyzed on a Renishaw INVIA REFLEX spectrometer coupled with a 532 nm laser. XRD patterns were collected using a Bruker/D8 Advance diffractometer (Cu Kα radiation). Nitrogen sorption isotherms were obtained using a BELSORP/max at 77 K. The specific surface area (SSA) was determined by the Brunauer–Emmett–Teller method and the pore size distributions were analyzed by a non‐linear density functional model. Chemical compositions were determined by XPS which was conducted on an Ultra DLD using a monochromic Al X‐ray source. FTIR spectra were acquired on a Thermo Nicolet Nexus 870 FTIR spectrometer. Solid‐state NMR spectra were recorded on a VNMRS 400 MHz spectrometer. The ion concentrations were measured by ICP‐OES (Avio 200, PE Instruments). TGA was performed using a TG‐DSC (Mettler Instruments).

The phenanthrene–GRSP mixtures at high concentrations were prepared in order to acquire better infrared spectra before freeze-drying. The obtained particles and GRSP particles were ground and formed into tablets with the spectrographic grade of KCl, respectively. All spectra were measured with a Nicolet Nexus 870 FT-IR spectrometer (Thermo Fisher Scientific Co., Ltd., United States) at 400–4,000 cm^–1.