The specific surface area, pore size distribution, and N2 adsorption-desorption isotherm of GO:PANI/ZNRs and GO:PANI/ZNRs/ZIF−8 were observed by the Brunauer–Emmet–Teller (BET, 3flex, Micromeritics, Norcross, GA, USA). The morphology of GO:PANI, GO:PANI/ZNRs, and GO:PANI/ZNRs/ZIF−8 was characterized using field emission-scanning electron microscope (FE-SEM, JSM-6700F, JEOL Ltd., Tokyo, Japan).
De d8 advance
The DE/D8 Advance is a versatile X-ray diffractometer (XRD) system designed for a wide range of applications. It features a high-precision goniometer and a selection of X-ray sources, detectors, and accessories to accommodate various sample types and research requirements.
Lab products found in correlation
2 protocols using de d8 advance
Comprehensive Characterization of Adsorbent Layers
The specific surface area, pore size distribution, and N2 adsorption-desorption isotherm of GO:PANI/ZNRs and GO:PANI/ZNRs/ZIF−8 were observed by the Brunauer–Emmet–Teller (BET, 3flex, Micromeritics, Norcross, GA, USA). The morphology of GO:PANI, GO:PANI/ZNRs, and GO:PANI/ZNRs/ZIF−8 was characterized using field emission-scanning electron microscope (FE-SEM, JSM-6700F, JEOL Ltd., Tokyo, Japan).
Characterization of Alg-α-TCP Hybrid Gels
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