Phi 1600 esca

Crystallographic properties of the annealed products were determined by XRD (Rigaku D/Max‐2500) with filtered Cu Kα radiation (λ = 1.5418 Å) in the 2θ range of 10°–90°. Morphological and microstructural studies were scrutinized by field‐emission scanning electron microscopy (FE‐SEM, JEOL JSM7500F) and TEM (TECNAI G2 20). Elemental analyses were ascertained by SEM‐ and TEM‐energy dispersive X‐ray spectrometer (EDS) mapping. Nitrogen adsorption–desorption isotherms obtained on a Micromeritics ASAP 2460 instrument (MicroActive) at 77 K were applied to evaluate the porosity and specific surface area. Raman spectra were gathered on a confocal Raman microscope (Thermo‐Fisher Scientific) using an argon‐ion laser (λ = 532 nm) in ambient air. The chemical content was ascertained by ICP atomic emission spectroscopy (ICP‐AES, Varian 725‐ES). X‐ray photoelectron spectrometry (XPS, Perkin Elmer PHI 1600 ESCA) was applied to investigate the valence states of the elements during cycling.
When it comes to in operando XRD characterizations, a particular mold battery was assembled employing beryllium foil as the testing window to allow X‐ray passage and carbon paper as the current collector, thus monitoring in situ reaction during cycling. Each scan was recorded in 0.02° incremental steps between 2θ = 12° and 42°. The charge/discharge test was conducted at 0.1 C.

The structure of the resultant TQBQ-COF material was examined by solid-state ¹³C NMR with Inova 400 MHz Spectrometer (Varian Inc., USA), and Fourier transform infrared spectroscopy (FTIR, Bruker 5700 TENSOR П) in range of 400–4000 cm⁻¹. Powder XRD (Rigaku MiniFlex600 × -ray generator, Cu Kα radiation, λ = 1.54178 Å), high-resolution transmission electron microscopy (HRTEM) and the selected area electron diffraction (SAED) pattern (Taols F200X G2) were applied to investigate the crystallinity and the microstructure of the TQBQ-COF powder. The elemental distributions of the TQBQ-COF material and the relevant electrodes before and after discharge/charge were characterized by scanning electron microscopy-Energy dispersive spectrum mapping (SEM-EDS), elemental analysis (EA, vario EL CUBE), and X-ray photoelectron spectroscopy (XPS, Perkin Elmer PHI 1600 ESCA), respectively. The morphologies of the TQBQ-COF material and the relevant electrodes were observed by scanning electron microscopy (SEM, JEOL JSM7500F), transmission electron microscopy (TEM, Taols F200X G2), and N₂ adsorption/desorption measurement (BEL Sorp mini). Moreover, Raman (DXR Microscope, Thermo Fisher Scientific with excitation at 532 nm) and TG-DSC analyzer (NETZSCH, STA 449 F3) were separately carried out to examine the structure and the stability of TQBQ-COF material, respectively.

The morphology of the prepared G&B‐S@Zn and bare Zn electrodes were characterized by SEM (FEI XL30 Sirion) at an accelerating voltage of 10 kV. The morphology of Zn deposition and after cycling were also obtained. EDS elemental maps were used to define the distribution of elements. The microstructures of the products were determined by TEM (FEI Tecnai G2 F30). AFM (Bruker Multimode 8 with a Nanoscope V controller) was used to further understand the morphology of the G&B‐S@Zn and bare Zn. Bruker Alpha FT‐IR spectrometer (ATR‐Ge, 1000–4000 cm⁻¹) were recorded on FT‐IR spectra. XPS measurements characterized the chemical composition of the G&B‐S@Zn sample on a spectrometer (PerkinElmer PHI 1600 ESCA) with Al Kα radiation (hv = 1486.6 eV). XRD (Bruker D8 Advance) with CuKα radiation range 5°–70°. The contact angle test (OCA20, Dataphysics, Germany) was characterized the wettability between the electrolyte and the G&B‐S interfacial layer. In situ DEMS (Hidden HPR‐40) was used to monitor the hydrogen evolution rate (R_H) during the plating/stripping of symmetric cells. In situ XRD test was used to investigate the Zn deposition process. QCM‐D (Biolin Scientific) was employed to characterize the mechanical properties of the G&B‐S film.