Proton nuclear magnetic resonance (1H NMR) spectroscopy was conducted on a Varian Unity 400 MHz spectrometer using deuterated water (D2O) as the solvent and a sample concentration of approximately 4 mg mL–1. Differential interference contrast (DIC) and fluorescence microscopy images of HA particles and capsules were obtained using an inverted Olympus IX71 microscope equipped with a DIC slider (U-DICT, Olympus), a UF1032 fluorescence filter cube, and a 100× oil immersion objective (Olympus UPFL20/0.5NA, W.D1.6). Transmission electron microscopy (TEM) images were taken using a FEI Tecnai TF20 instrument with an operation voltage of 200 kV. Atomic force microscopy (AFM) experiments were performed with a JPK NanoWizard II BioAFM. Typical scans were performed in intermittent contact mode with MikroMasch silicon cantilevers (NSC/CSC). The film thickness of the capsules was analyzed using JPK SPM image processing software (version V.3.3.32).
Tecnai tf20 instrument
Manufactured by Thermo Fisher Scientific
The Tecnai TF20 is a transmission electron microscope (TEM) instrument manufactured by Thermo Fisher Scientific. It is designed to provide high-resolution imaging and analysis of samples at the nanometer scale. The core function of the Tecnai TF20 is to enable the observation and characterization of various materials and specimens using electron beam technology.
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2 protocols using tecnai tf20 instrument
1
Characterization of Hyaluronic Acid Particles
2
Characterization of Euc/Fe III Capsules
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Differential interference contrast (DIC) microscopy images of Euc/Fe III capsules were taken on an inverted Olympus IX71 microscope. Ultraviolet-visible (UV-vis) absorption spectra were recorded on a SPECORD 250 PLUS UV-vis spectrophotometer. Atomic force microscopy (AFM) measurements were performed on a JPK NanoWizard II BioAFM. Scans were recorded in tapping mode using MikroMasch silicon cantilevers (NSC/CSC). Morphology and element distribution determination were performed by transmission electron microscopy (TEM) and energy-dispersive X-ray spectroscopy (EDX) on a FEI Tecnai TF20 instrument at an operation voltage of 200 kV. For the sample preparation for the AFM and TEM/EDX experiments, 5 μL capsule suspensions were allowed to air dry on glass slides (pretreated with Piranha solution) and Formvar carbon-coated copper grids, respectively. X-ray photoelectron spectroscopy (XPS) analysis was conducted on a VG ESCALAB220i-XL spectrometer equipped with a hemispherical analyzer. The energy calibration of XPS was referenced to the C 1s peak at 285.0 eV.
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