Optical transmission and reflection spectra were collected using a Lambda 1050+ UV/Vis/NIR spectrophotometer (PerkinElmer, UK) equipped with an integrating sphere. Temperature-dependent UV-Vis-NIR absorption spectra were collected by UV/Vis/NIR spectrophotometer (Shimadzu UV-3600, Japan). TEM observations were performed using a FEI Tools F200S field-emission transmission electron microscope (FEI Co., USA) operated at 200 kV. DSC measurements were carried out on Mettler DSC 3 (Mettler Toledo, Switzerland) instrument with the standard sample of sapphire for comparison. SEM measurements were performed with SU-8230 microscope (Hitachi, Ltd.) equipped with a cold field-emission gun able to accelerate the electron at 30 kV. XRD patterns were recorded by a Bruker D8 FOCUS advance X-ray diffractometer operated at 40 kV and 200 mA current under Cu Kα radiation (wavelength of 1.5418 Å).
D8 focus advance x
Manufactured by Bruker
Sourced in Germany
The Bruker D8 FOCUS advance X-ray diffractometer is a versatile and high-performance instrument designed for a wide range of X-ray diffraction applications. It features a compact and robust design, advanced optics, and a powerful X-ray source to provide accurate and reliable data for materials characterization.
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Lab products found in correlation
Lambda 1050 uv vis nir spectrophotometer, by PerkinElmer (1 mentions)
Mettler dsc 3, by Mettler Toledo (1 mentions)
Uv 3600, by Shimadzu (1 mentions)
Su8230 microscope, by Hitachi (1 mentions)
F 4500 fluorescence spectrophotometer, by Hitachi (1 mentions)
Uv 2600, by Shimadzu (1 mentions)
Eds spectrometer, by Hitachi (1 mentions)
2 protocols using d8 focus advance x
1
Characterization of Materials by Advanced Spectroscopy
2
Comprehensive Materials Characterization Protocol
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The X-ray diffraction (XRD) patterns for the obtained samples were recorded using a Bruker D8 Focus Advance X-ray diffractometer (Bruker, Germany) with Cu-Kα radiation (λ = 0.15406 nm). The microstructures and chemical composition were determined using a SU8220 field-emission scanning electron microscope with an EDS spectrometer (Hitachi, Japan). High-resolution transmission electron microscope (HR-TEM) images were obtained using a JEM-2100 HR-TEM microscope (JEOL, Japan). Photoluminescence spectra and persistent luminescence decay curves were obtained using an F-4500 fluorescence spectrophotometer (Hitachi, Japan). Ultraviolet-visible (UV-vis) diffuse reflectance spectra were recorded using a UV-vis spectrophotometer (Shimadzu UV-2600, Japan).
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