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Phenom scanning electron microscope

Manufactured by Thermo Fisher Scientific
Sourced in United States

The Phenom scanning electron microscope is a compact and user-friendly imaging tool designed for high-resolution visualization of samples. It utilizes an electron beam to scan the surface of a specimen, producing detailed images that reveal the sample's morphology and topography.

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5 protocols using phenom scanning electron microscope

1

Scaffold Characterization by SEM and Live/Dead Staining

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The fibrous PLA-based scaffolds and implants were analyzed with the Phenom scanning electron microscope (SEM) supported with image software (FEI, USA). All SEM samples were incubated in 0.5 % OsO4 for 1 h at 4 °C, then dehydrated/desiccated with anhydrous ethanol, next automatically critical point dried (Leica EM CPD300, Germany), and finally coated with 15-nm layer of gold (K550 Emitech, USA) prior to SEM analysis.
Live/Dead Cell Staining Kit (Sigma Aldrich, USA) was utilized for simultaneous fluorescence staining and visualization (Nikon Eclipse Ti microscope) of viable and dead cells.
The implants were also analyzed with the Zeiss Axiovert 100 M confocal laser scanning microscope (CLSM) supported with LSM 510 META software (Carl Zeiss Jena GmbH, Germany). CP5 cells were stained (500 ng mL−1) with phalloidin—tetramethylrhodamine B isothiocyanate (phalloidin-TRITC; Sigma, USA) to identify filamentous actin and with DRAQ5™ (Biostatus, UK) intercalating anthraquinone to visualize chromatin. Each imaging analysis was performed at least three times using material collected during three independent experiments.
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2

Bioabsorbable Sutures Surface Morphology

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The specific surface morphology of the bioabsorbable sutures were investigated before and after coating using a scanning electron microscope (Phenom™ Scanning Electron Microscope, FEI Company, OR, USA). Before analysis, bioabsorbable suture samples (approximately 1 cm in length) were mounted onto aluminium stubs, secured with carbon adhesive tape, and coated with carbon and palladium/gold in a 2:1 ratio.
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3

Scanning Electron Microscopy of Microparticles

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The SEM analysis was carried out on the optimized microparticles and the MGDDS using a Phenom™ scanning electron microscope (FEI Company, Hillsboro, OR, USA). Prior to the analysis, the samples were gold-sputter coated (SPI Module™ Sputter Coater, SPI Supplies, West Chester, PA, USA) for 90 s (18 mA).
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4

Scanning Electron Microscopy of Crystal Patterns

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In
order to observe the
crystal patterns at a higher magnification and a higher depth of field
than feasible with optical microscopy, we used scanning electron microscopy
(SEM). The creeping patterns were fully dried in a climate chamber
at 20 °C and 50% R.H. and then sputtered with Au using a Cressington
108 auto sputter coater. The samples were imaged using a FEI Phenom
scanning electron microscope in backscattering mode at 5 kV.
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5

Powder Characterization via SEM Imaging

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Each powder formulation was placed onto a scanning electron microscope (SEM) mount and was coated for 3 min by an Emitech, K550X Sputter coater (Quorum Technologies Ltd, East Sussex, UK) to form a thin layer of gold with 20 nm thickness. SEM images were taken under a Phenom scanning electron microscope (FEI Company, Hillsboro, Oregon, USA).
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