For characterization, X-ray diffraction (XRD) measurements of the samples were performed on a smart X-ray diffractometer (Rigaku, Japan) using Cu Kα radiation, with a scanning rate of 10° S−1 and 2θ range from 10 to 80°. The morphologies of the samples were determined through scanning electron microscopy (SEM; Gemini 300; Zeiss, Jena, Germany). Transmission electron microscopy (TEM), high-resolution TEM (HRTEM), scanning transmission electron microscopy (STEM), and energy dispersive spectrometry (EDS) mapping measurements were obtained with an FEI Talos F200s instrument (Thermo Fisher Scientific, USA). The elemental composition was obtained through X-ray photoelectron spectroscopy (XPS; Thermo Fisher Scientific, Waltham, MA, USA). The optical absorbance was determined using a UV-Vis spectrophotometer (PE Lambda 950; Perkin Elmer, Waltham, MA, USA). The steady state photoluminescence (PL) emission spectra and time-resolved fluorescence spectra were obtained using a steady state and transient state fluorescence spectrometer (FLS1000; Edinburgh Instruments, Livingston, UK). The existence of free radicals was performed on electron paramagnetic resonance (EPR) spectrometer (Bruker EMXplus-6/1, Bruker, Germany).
Pe lambda 950
Manufactured by PerkinElmer
Sourced in United States
The PE Lambda 950 is a high-performance UV-Vis-NIR spectrophotometer designed for accurate and reliable measurements across a wide range of applications. It features a dual-beam optical system, a wavelength range of 175 to 3300 nm, and advanced optics for superior photometric performance.
Automatically generated - may contain errors
Lab products found in correlation
D8 advance, by Bruker (2 mentions)
Jem 2100, by JEOL (2 mentions)
K alpha, by Thermo Fisher Scientific (2 mentions)
Gemini 300, by Zeiss (1 mentions)
Fls1000, by Edinburgh Instruments (1 mentions)
Fei nova nanosem 450, by Thermo Fisher Scientific (1 mentions)
Axis ultra dld, by Shimadzu (1 mentions)
Talos f200x, by Thermo Fisher Scientific (1 mentions)
Geminisem 300, by Zeiss (1 mentions)
Alpha 300r, by WITec (1 mentions)
Dm2700m, by Leica (1 mentions)
S 4800, by Hitachi (1 mentions)
Chi 660e, by CH Instruments (1 mentions)
Labx xrd 6100, by Shimadzu (1 mentions)
Escalab xi, by Thermo Fisher Scientific (1 mentions)
Nexion 350d, by PerkinElmer (1 mentions)
Lambda 950, by PerkinElmer (1 mentions)
Jem 2010, by JEOL (1 mentions)
Nova nanosem 450, by Thermo Fisher Scientific (1 mentions)
Zetasizer nano zs instrument, by Malvern Panalytical (1 mentions)
7 protocols using pe lambda 950
1
Comprehensive Material Characterization Protocol
2
Comprehensive Material Characterization Techniques
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SEM images were taken on a scanning electron microscope (FEI Nova NanoSEM 450, Thermo Fisher Scientific, Waltham, MA, USA), at the working distance of 5 mm, operation voltage of 5 kV and spot size of 3.0 nm. XRD patterns were collected on an X-ray diffractometer (BRUKER D8-ADVANCE, Bruker Co., Karlsruhe, Germany) using Cu Kα (λ = 1.5418 Å) radiation, with operation voltage 40 kV and current 40 mA, respectively. TEM images and SAED were observed on a transmission electron microscope (JEOL JEM-2100, JEOL, LTD, Akishima, Japan) at an acceleration voltage of 200 kV. UV–vis absorption spectra were obtained by using an UV-Vis spectrophotometer (PE Lambda 950, PerkinElmer Inc., Waltham, MA, USA) with a wavelength range of 300–800 nm. FTIR spectra were recorded on a Fourier transform infrared spectrometer (NICOLET AVATAR 360, Nicolet Instrument Corp., Richardson, TX, USA) with a wavenumber range of 4000–500 cm−1.
3
Characterization of Electromagnetic Properties
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The phase, structure and morphology of the samples were characterized by X-ray diffraction (XRD, PANalytical X’pert MPD PRO, Cu Kα, λ = 0.15406 nm, Malvern Panalytical, Malvern, UK), Raman spectra (WITec Alpha 300R, WITec, Ulm, Germany), field emission scanning electron microscopy (SEM, ZEISS GeminiSEM 300, ZEISS, Beijing, China) and Transmission Electron Microscope (TEM, Talos F200X, Thermo Fisher, Shanghai, China). Defects and chemical states were characterized by UV–Vis diffuse reflectance spectra (DRS, PE Lambda 950, Perkin Elmer, Shanghai, China), photoluminescence spectra (PL, Gangdong F-320, Gangdong, Tianjin, China) and X-ray photoelectron spectroscopy (XPS, Kratos Axis Ultra DLD, Kratos, Manchester, UK). The prepared samples were uniformly mixed with paraffin at a weight ratio of 1:1, and then pressed into a ring-shaped mold (dout = 7.0 mm, din = 3.04 mm). The electromagnetic parameters were measured on an Agilent N5230A vector network analyzer (Agilent, Beijing, China) in frequency range of 2–18 GHz.
4
Spectroscopic Characterization of Samples
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The UV-Vis absorption spectra of samples were recorded by a spectrometer (PE Lambda950) from the PERKINELMER company.
5
Characterization of Ultrathin Conductive Films
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The transparency and reflectivity of ultra-thin Ag conductive films and G/ACF films were measured using UV-Vis spectroscopy (UV-Vis spectrometer, PE Lambda 950, PerkinElmer, Waltham, MA, USA). The sheet resistance (Rs) was measured using a surface resistance meter (SRM-12TH, NAGY, Bavaria, Germany). The morphology of graphene nanosheets and the ACF and G/ACF films after corrosion was evaluated with a field-emission scanning electron microscope (FE-SEM, S-4800, Hitachi, Tokyo, Japan). The salt spray test was carried out in the salt spray box (PS-60, Beijing Yashilin testing equipment, Beijing, China) and the corrosion electrochemical experiment was tested by electrochemical workstation (CHI 660E, Chinstruments, Shanghai, China). Raman spectra and mapping (Renishaw, New Mills, Wotton-under-Edge, Gloucestershire, United Kingdom), microscopic characterization (DM2700M, Leica, Ernst-Leitz-Strasse 17–37 Wetzlar, Germany), and a contact angle test (CA500, Dataphysics, Stuttgart, Germany) were also carried out. In order to determine the chemical state of the silver layer surface, we prepared “Glass/SiNx/AZO/Ag/AZOII” samples, of which the AZOII layer was just used to prevent the oxidation of the silver. Its thickness was only about 3 nm, so that we could use an ordinary X-ray photoelectron spectroscopy (XPS, K-Alpha, Thermo Fisher, Waltham, MA, USA) to detect the silver layer surface.
6
Advanced Characterization of Nanomaterials
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X-ray photoelectron spectroscopy (XPS) measurements were carried out by the X-ray photoelectron spectrometer (ESCALAB Xi+, Thermo Fisher, USA). All binding energies were calibrated using the C 1 s peak at 284.6 eV. The Pt content of the sample was determined by inductively coupled plasma mass spectrometry (ICP-MS; NexION 350D, PerkinElmer, USA). Electron paramagnetic resonance (EPR) spectra of the samples were acquired by the X-band spectrometer (EMXplus A300–9.5/12/S-LC, Bruker, Germany). X-ray diffraction (XRD; LabX XRD-6100, SHIMADZU, Japan) measurements were used to characterize the crystal structures of the samples. The high-resolution transmission electron microscopy (HRTEM; JEM-2100, JEOL, Japan) images were acquired to characterize the morphologies of the samples. Ultraviolet-visible-near infrared diffuse reflectance spectra (UV–vis-NIR DRS) were taken using a UV-VIS-NIR spectrometer (Lambda 950, PerkinElmer, USA). The photoluminescence (PL) properties were investigated by fluorescence spectrophotometer (PE Lambda950, PerkinElmer, USA) with the excitation light at 270 nm.
7
Comprehensive Nanomaterial Characterization Protocol
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SEM (Nova-Nano SEM 450, FEI, America) and TEM (JEOL JEM-2010, JEOL, Japan) were used to characterize the morphology. The compositions of products were analyzed by X-ray diffraction (D8-ADVANCE, Bruker, Germany) and an Infrared Fourier Transform Spectrometer (VERTEX 70, Bruker, Germany). Nitrogen adsorption isotherms were obtained at 273 K with a Quadrasorb TM SI Four Station Surface Area Analyzer and Pore Size Analyzer (Quadrasorb SI-4, Quantachrome, America). The UV-Vis-NIR absorbance spectra of samples were obtained using a UV-Vis-NIR spectrophotometer (PE Lambda 950, PerkinElmer, America). The fluorescence image of the cells was detected by laser scanning confocal microscopy (Zeiss 880, Carl Zeiss, Germany). The average size distribution and zeta potential of the nanoparticles were assessed by the Zetasizer Nano ZS instrument (Malvern Instruments, UK).
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