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47 protocols using sigma 300 vp

1

Surface Analysis of Samples

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In order to realize this test, the samples were prepared and placed inside the Zeiss Sigma 300 VP (Zeiss, Jena, Germany) microscope using a sample holder, and a vacuum was applied. Then, using SmartSEM, an image of the surface of the sample was taken at 1000× magnification and for 20kV, and, using SmartEDX, the quantitative microanalysis of the sample was carried out, obtaining the percentages of the elements and the spectrum.
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2

Low-Voltage SEM Characterization of Surfaces

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The characterization of the surfaces was performed at low acceleration voltages of the electron beam (low voltage scanning electron microscopy, LVSEM, Technologies Inc., Salem, OR, USA) using the high resolution scanning electron microscope Zeiss Sigma 300 VP (Zeiss, Oberkochen, Germany) and the Everhart-Thornley Secondary Electron Detector (ETD, SE2 according to the databar of the micrographs, Oberkochen, Germany). All images were acquired at an acceleration voltage of 0.65 kV (i.e., the landing energy of the electrons is 0.65 keV) at small working distances with a magnification of 500× (horizontal image field width: 228.7 μm). Each of the samples was cut in squares measuring 1.5 cm × 1.5 cm. These squares were mounted on SEM stubs using a conductive double-faced adhesive carbon tape with no further preparation since LVSEM enables imaging of surfaces without coating [47 (link)].
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3

Fungal Growth on PET Surfaces

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Scanning electron microscopy (SEM) analysis was performed at KCS Biotech SRL (Vergiate (VA), Italy) and Arvedi Laboratory (University of Pavia, Italy) to visualise the placement of the fungus on the PET fragment. Microstructural characterization was performed employing a TESCAN, Mira 3 XMU (TESCAN, Brno, Cechia) operating at 8 kV and equipped with an In-Beam SE detector and a ZEISS Sigma 300VP (Carl Zeiss, Oberkochen, Germany) operating at 10 kV. Samples were previously coated with platinum (Pt) using a Cressington 208HR (Cressington Scientific Instruments, Watford, UK).
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4

Titanium Surface Cleaning Protocols

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For a surface analysis, one additional ti-base abutment for each group (n = 1) underwent contamination and cleaning. Five ti-base abutments were analyzed under a scanning electron microscope (SEM) (Zeiss Sigma 300 VP, Carl Zeiss Microscopy GmbH, Jena, Germany) for the surface characterization of the titanium surfaces after each cleaning protocol.
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5

Visualizing Yeast Biofilm Architecture

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The yeast morphology and visualization of sessile cells and PCs, together with the topography and architecture of biofilms, were monitored by SEM (Sigma 300VP; Carl ZEISS, Oberkochen, Germany) and performed onto 5 mm-side silicon stubs placed into a 24 wells-microtiter plate (Greiner Bio-One, Germany) following the same procedure described above. Afterward, samples were fixed, dried by the critical point drying method, and coated with carbon (graphite). Micrographs were obtained from 10 randomly selected positions (number of fields of view) using a magnification of 500x to 5000x. Then, the histogram of sessile cell size distribution was determined based on the length (µm) of yeast cells after different treatments. The mean, median, and mode were calculated from the histogram analysis of cell size distribution [19 (link), 39 (link)].
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6

Enamel Surface Analysis via SEM

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Additional samples representing the enamel surface of each group, without applying the adhesive and resin composite, were further analyzed by using a scanning electron microscope (SEM) (Sigma 300VP, Zeiss, Oberkochen, Germany). A qualitative evaluation was made to compare the effect of each etching mode on the surface.
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7

Comprehensive Microscopic Analysis of Insect Specimens

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After preliminary sorting 1091 specimens were studied. Some of them were mounted in Hoyer’s medium for examination under a compound microscope using phase contrast and DIC objectives. Some were cleared previously in Nesbitt’s fluid. The remaining samples were fixed and stored in 70–80% ethyl alcohol.
The slides were observed under two microscopes: an Olympus BX51-TF (Olympus Group, Tokyo, Japan) with multiple viewing and phase contrast and a Zeiss model Axio Imager.A1 with differential interference contrast (DIC). For measurements, a U-DA drawing attachment UIS (Universal Infinity System) and a scale calibrated with a slide by Graticules Ltd., Cambridge, UK (1 mm divided in 100 parts) were used. For SEM (Scanning Electron Microscopy) the specimens were dehydrated using series of ethyl alcohol followed by critical-point drying in CO2, then mounted on aluminum SEM stubs, and coated in an Argon atmosphere with 16 nm gold in a sputter-coater Emitech Ltd., Strovolos, Chipre, model K550. SEM observations were made with a FE-SEM Zeiss model Sigma 300 VP (Zeiss, Oberkochen, Germany).
The specimens studied will form part of the collections of the Museum of Zoology of the University of Navarra and the Collection of Insects of the University of Madeira, although some paratypes will be deposited in the Museum of Natural Sciences of Madrid.
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8

Senckenberg Institute Specimen Preparation

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Specimens were collected for the Northern Lao-European Cave Project, and kept in 70% ethanol. The holotypes and a number of paratypes are deposited in the zoological collection of the Senckenberg Research Institute and Natural History Museum (SMF), with some material also to be housed in the Zoological Research Museum A. Koenig (ZFMK).
Observation and dissections were performed using an Olympus SZ51 stereo microscope. The line drawings were prepared with the help of an Olympus BX51 microscope and an attached camera for the scope. SEM micrographs were taken using a ZEISS Sigma 300VP scanning electron microscope (based at the ZFMK). Dry SEM material was coated with gold, removed after study from stubs and returned to alcohol. The photographs were taken with Canon EOS 7D cameras and further processed using Adobe Photoshop CS6 software.
The terminology used here follows that of Golovatch et al. (2009a , 2009b ).
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9

Elemental Mapping of Decorated WSe2 Nanoribbons

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Zeiss Sigma 300 VP coupled with EDS Detector Oxford SDD 80 was used to obtain the elemental map from the decorated WSe2 nanoribbons covered within 5–10 nm carbon coating to minimize surface changing and image drifting during the long-term measurements.
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10

Characterization of Spray-Dried WC-Co Granules

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Spray-dried and sintered WC–Co granules (88:12 wt%) with an apparent density of 4.93 g/cm3 were used as the starting material. The granule size distribution was investigated using laser diffraction (HELOS H4299, Sympatec GmbH, Clausthal-Zellerfeld, Germany). Scanning electron microscopy (Sigma 300 VP, Carl Zeiss Microscopy GmbH, Oberkochen, Germany) was used to determine the morphology and the inner structure of the granules. For morphology analysis, a powder sample was homogeneously distributed on a SEM sample holder using the Nebula Particle Disperser (Thermo Fisher Scientific, Dreieich, Germany). The WC particle FERETmax distribution, inner porosity fraction and the chemical composition of the granules were investigated in cross-section SEM images. Quantitative microstructure analysis in combination with machine-learning based pixel segmentation (ZEN core 3.2, Carl Zeiss Microscopy GmbH, Oberkochen, Germany) was applied to quantify the characteristics of the granules. To evaluate the WC particle FERETmax distribution, >1000 WC particles were evaluated. A total of 20 g of the WC–Co granules were used for the multi-point BET (Brunauer–Emmett–Teller) surface area measurement using nitrogen adsorption at 77.4 K (Quantachrome NOVA4200e, Anton Paar QuantaTec Inc., Boynton Beach, FL, USA). The samples were degassed for 1 h at 200 °C under vacuum before measurement.
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