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Xrd 7000 instrument

Manufactured by Shimadzu

The Shimadzu XRD-7000 is an X-ray diffractometer designed for the analysis of crystalline materials. It is capable of identifying and quantifying the crystalline phases present in a sample, as well as determining the structural parameters of those phases. The instrument uses a monochromatic X-ray beam to irradiate the sample, and the diffracted X-rays are detected and analyzed to provide information about the sample's crystalline structure.

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2 protocols using xrd 7000 instrument

1

Comprehensive Materials Characterization Protocol

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The Fourier transform infrared (FTIR) spectra were monitored by employing a VERTEX 70 spectrometer (Bruker, Germany). The materials were grounded with KBr (1:100) and then compressed to form tables. The X-ray diffraction (XRD) patterns were collected with a Shimadzu XRD-7000 instrument at a scan rate of 0.02°·S−1 with a 2θ range of 20°–80° and Cu Κα radiation (λ = 0.1542 nm). XPS spectra were obtained via an Escalab 250 Xi spectrometer (Thermo Fisher Scientific Inc., Waltham, MA, USA) with a monochromated source of X-rays (Al Kα, 1486.6 photo energy) as the excitation source. SEM measurements were conducted on a TESCAN MIRA LMS microscope equipped with energy-dispersive X-ray spectrometry (Xplore 30, Oxford, UK). The thermal behavior analyses were conducted in an N2 atmosphere between room temperature and 800°C at a rate of 10 °C·min−1 using a Q50 thermogravimetric analyzer (TA Instruments- Waters LLC, New Castle, DE, USA). The magnetic properties of the samples were measured using a LakeShore 7404S vibrational sample magnetometer (Lake Shore Cryotronics, Inc., Westerville, OH, USA). The thermal behavior analyses were conducted in an N2 atmosphere between room temperature and 800°C at a rate of 10 °C·min−1 using a Q50 thermogravimetric analyzer (TA Instruments- Waters LLC, New Castle, DE, USA).
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2

Comprehensive Materials Characterization Protocol

Check if the same lab product or an alternative is used in the 5 most similar protocols
The Fourier transform infrared (FTIR) spectra were monitored by employing a VERTEX 70 spectrometer (Bruker, Germany). The materials were grounded with KBr (1:100) and then compressed to form tables. The X-ray diffraction (XRD) patterns were collected with a Shimadzu XRD-7000 instrument at a scan rate of 0.02°·S−1 with a 2θ range of 20°–80° and Cu Κα radiation (λ = 0.1542 nm). XPS spectra were obtained via an Escalab 250 Xi spectrometer (Thermo Fisher Scientific Inc., Waltham, MA, USA) with a monochromated source of X-rays (Al Kα, 1486.6 photo energy) as the excitation source. SEM measurements were conducted on a TESCAN MIRA LMS microscope equipped with energy-dispersive X-ray spectrometry (Xplore 30, Oxford, UK). The thermal behavior analyses were conducted in an N2 atmosphere between room temperature and 800°C at a rate of 10 °C·min−1 using a Q50 thermogravimetric analyzer (TA Instruments- Waters LLC, New Castle, DE, USA). The magnetic properties of the samples were measured using a LakeShore 7404S vibrational sample magnetometer (Lake Shore Cryotronics, Inc., Westerville, OH, USA). The thermal behavior analyses were conducted in an N2 atmosphere between room temperature and 800°C at a rate of 10 °C·min−1 using a Q50 thermogravimetric analyzer (TA Instruments- Waters LLC, New Castle, DE, USA).
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