The photoelectrons were detected with a hemispherical analyzer located at a take-off angle of 45° with respect to the normal sample surface. Survey-scan spectra were acquired at a pass energy of 187.85 eV, while, for C 1s, individual high-resolution spectra were taken at a pass energy of 29.35 eV with a 0.125-eV energy step. An additional electron gun was used for charge neutralization. All spectra were referenced to the main C 1s peak of the carbon atoms, which was assigned a value of 284.8 eV. The spectra were analyzed using MultiPak v8.1c software (Ulvac-Phi Inc., Kanagawa, Japan, 2006) from Physical Electronics, which was supplied with the spectrometer.
Tfa xps instrument
The TFA XPS instrument is a laboratory equipment designed for X-ray Photoelectron Spectroscopy (XPS) analysis. It provides the capability to perform surface chemical analysis on a wide range of materials. The core function of the TFA XPS instrument is to detect and measure the energy of photoelectrons emitted from a sample surface when exposed to X-ray radiation, allowing for the identification and quantification of the elements present in the sample.
Lab products found in correlation
2 protocols using tfa xps instrument
XPS Analysis of Coated Polymer Foils
The photoelectrons were detected with a hemispherical analyzer located at a take-off angle of 45° with respect to the normal sample surface. Survey-scan spectra were acquired at a pass energy of 187.85 eV, while, for C 1s, individual high-resolution spectra were taken at a pass energy of 29.35 eV with a 0.125-eV energy step. An additional electron gun was used for charge neutralization. All spectra were referenced to the main C 1s peak of the carbon atoms, which was assigned a value of 284.8 eV. The spectra were analyzed using MultiPak v8.1c software (Ulvac-Phi Inc., Kanagawa, Japan, 2006) from Physical Electronics, which was supplied with the spectrometer.
X-ray Photoelectron Spectroscopy Analysis
of the samples after the peel-off test was determined using a TFA
XPS instrument from Physical Electronics GmbH (Feldkirchen/Münich,
Germany). The ultimate pressure in the XPS chamber was 6 × 10–8 Pa. The samples were exposed to X-rays from monochromatic
Al Kα1,2 radiation at 1486.6 eV. The diameter of
an analysis area was 400 μm. The photoelectrons were detected
with a hemispherical analyzer placed at a take-off angle of 45°
with respect to the normal sample surface. Survey-scan spectra were
measured at a pass energy of 187.85 eV with a 0.4 eV energy step.
An additional electron gun was used for charge neutralization during
the acquisition of spectra. All spectra were referenced to the main
C 1s peak of the carbon atoms, which was assigned a value of 285 eV.
The elemental composition was determined using MultiPak v8.1c software
from Physical Electronics, which was supplied with the spectrometer.
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