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Jpk nanowizard 2 afm

Manufactured by Bruker
Sourced in Germany

The JPK NanoWizard II AFM is an atomic force microscope that provides high-resolution imaging and nanomechanical characterization of surfaces and samples. It offers advanced functionalities for topography, force spectroscopy, and various imaging modes.

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6 protocols using jpk nanowizard 2 afm

1

Atomic Force Microscopy of Pre-wetted TIPS Microspheres

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Pre-wetted TIPS microspheres were mounted on sterile glass slides using super glue and imaged under deionized water in intermittent contact (liquid) mode employing a JPK NanoWizard II AFM (JPK Instruments, Germany) mounted on an Olympus IX71 inverted microscope. MSNL-10 cantilevers (Bruker, Santa Barbara, USA), tuned to a drive frequency of ∼46 kHz (nominal resonant frequency 25–50 kHz), were employed with a constant line rate of 0.5 Hz. Gain parameters and set point were adjusted according to each sample. Thermal resonance calibration yielded a cantilever spring constant of 0.11 N/m (nominal value 0.1 N/m). After focusing on an area of interest, images with different scan sizes of 5 × 5 µm were obtained at random sites of each sample and processed with the Gwyddion 2.37 SPM software.
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2

Atomic Force Microscopy of Red Blood Cells

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Experiments were carried out at room temperature (23 °C) in a JPK Nanowizard II AFM (JPK Instruments, Berlin, Germany). Images were captured at 1 Hz with 512 × 512 pixels. For this purpose, V-shaped MLCT silicon nitride cantilevers were used (Bruker AXS, Karlsruhe, Germany) in contact mode, with enough force to reduce the overestimation of cell diameters at the edges without compromising cell integrity. Images were collected at 512 × 512-pixel resolution at a scanning rate of 1 Hz and line-fitted using the JPK Data Processing software as required. Cell diameters were measured on the images along the Y and X axis for each cell, combining both data (as RBC have almost circular shape when attached to support). Cell thickness was measured by cross-section analysis of the RBC images.
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3

Atomic Force Microscopy of Osteogenic Cells

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Titanium plates seeded with 3200 cells per 25mm2 plate, cultured in osteogenic medium for a total of 34 days and fixed in 4% PFA. The plates were washed extensively over a period of weeks with ddH2O to remove the mineral and then subjected to contact mode AFM. Force spectroscopy measurements, yielding force-distance curves, were performed in ddH2O using a JPK NanoWizard II AFM (JPK Instruments AG, Berlin, Germany). Measurements were conducted at ambient temperature and the samples were conscientiously maintained in a hydrated state. The cantilevers used were V-shaped silicon nitride cantilevers with a spring constant of 0.1 N/m (Bruker, Camarillo, CA). The cantilever deflection sensitivity was obtained by indenting the tip against a glass substrate and the tip radius was measured to be 26nm. Three to six sections of the surface were measured and a 10μm × 10μm area was scanned per section, with probe velocities of 1-5μm/s. To determine the Young's modulus, a Hertzian model was applied to the extension force-displacement curves with the appropriate fit range manually determined for each curve using JPK Image Processing Software (JPK Instruments AG, Berlin, Germany). In our calculations, we assumed the tip to be a paraboloidal indenter.
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4

Measurement of Scaffold Modulus by AFM

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The
surface Young’s moduli of 3D printed scaffolds of either CNF
or CNF/GelMA scaffolds were measured using a JPK Nanowizard II AFM
(JPK Instruments AG, Berlin, Germany). Force measurements were performed
in PBS using a DNP-S10 silicon nitride cantilever (spring constant
∼0.06 N m–1) with a 10 nm round tip. The
spring constant of each cantilever was calibrated using the thermal
method, and the deflection sensitivity was determined by performing
a force measurement on a clean glass slide in PBS prior to undertaking
measurements on the scaffolds. Force measurements were performed at
a minimum of three different locations on each scaffold, with five
separate measurements taken at each location and averaged. Three separate
scaffolds were analyzed for each material.
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5

Polymer Film Surface Morphology Analysis

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The morphology of the polymer film surfaces were explored using a JPK Nanowizard II AFM (JPK Instruments AG, Germany). Images were obtained in air using intermittent contact mode AFM with a Nanoworld silica nitride cantilever (spring constant 40 N/m). Image scan of 5 µm×5 µm were obtained at a scan rate of 1 Hz. Roughness values and total surface area measurements were calculated using SPM Image Processing software V.3 (JPK Instruments AG, Germany) and Gwyddion SPM software (version 2.34).
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6

Measuring Cell/Tissue Stiffness with AFM

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For measurements of cell/tissue stiffness, a JPK NanoWizard II AFM with BioCell (JPK Instruments, Berlin, Germany) was equipped and manipulated as previously described (Chiou et al., 2013; Harn et al., 2015; Lin et al., 2015) and as detailed in the Supplementary Materials and Methods.
Preparation and fabrication of PA gels PA gels with uniform stiffness were prepared as previously described (Chen et al., 2014; Lin et al., 2015) and as detailed in the Supplementary Materials and Methods. The Young's moduli of the PA gels used were as follows: 2-and 20-kPa PA gels represented the elastic modulus of normal and keloid dermis, respectively. PA gels from each polymerization batch were checked to verify consistent matrix mechanical properties by AFM.
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