Jpk nanowizard 2 afm
The JPK NanoWizard II AFM is an atomic force microscope that provides high-resolution imaging and nanomechanical characterization of surfaces and samples. It offers advanced functionalities for topography, force spectroscopy, and various imaging modes.
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6 protocols using jpk nanowizard 2 afm
Atomic Force Microscopy of Pre-wetted TIPS Microspheres
Atomic Force Microscopy of Red Blood Cells
Atomic Force Microscopy of Osteogenic Cells
Measurement of Scaffold Modulus by AFM
surface Young’s moduli of 3D printed scaffolds of either CNF
or CNF/GelMA scaffolds were measured using a JPK Nanowizard II AFM
(JPK Instruments AG, Berlin, Germany). Force measurements were performed
in PBS using a DNP-S10 silicon nitride cantilever (spring constant
∼0.06 N m–1) with a 10 nm round tip. The
spring constant of each cantilever was calibrated using the thermal
method, and the deflection sensitivity was determined by performing
a force measurement on a clean glass slide in PBS prior to undertaking
measurements on the scaffolds. Force measurements were performed at
a minimum of three different locations on each scaffold, with five
separate measurements taken at each location and averaged. Three separate
scaffolds were analyzed for each material.
Polymer Film Surface Morphology Analysis
Measuring Cell/Tissue Stiffness with AFM
Preparation and fabrication of PA gels PA gels with uniform stiffness were prepared as previously described (Chen et al., 2014; Lin et al., 2015) and as detailed in the Supplementary Materials and Methods. The Young's moduli of the PA gels used were as follows: 2-and 20-kPa PA gels represented the elastic modulus of normal and keloid dermis, respectively. PA gels from each polymerization batch were checked to verify consistent matrix mechanical properties by AFM.
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