Jsm 7610f sem
The JSM-7610F is a field emission scanning electron microscope (FE-SEM) manufactured by JEOL. Its core function is to produce high-resolution images of samples by scanning the surface with a focused beam of electrons. The JSM-7610F is capable of achieving a high-resolution of up to 0.8 nm at 15 kV.
Lab products found in correlation
8 protocols using jsm 7610f sem
Visualizing Nano-Sized Extracellular Vesicles
Scanning Electron Microscopy of Mycelial and Spore Cells
SEM Characterization of Microparticles
Calcium Deposition on TiO2 Particles
Comprehensive Characterization of Biochar
Corrosion Products Characterization
Facile Hydrothermal Synthesis of Ag-CuO Nanoparticles
Membrane Morphology Analysis via SEM
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