Mira lms microscope

The Fourier transform infrared (FTIR) spectra were monitored by employing a VERTEX 70 spectrometer (Bruker, Germany). The materials were grounded with KBr (1:100) and then compressed to form tables. The X-ray diffraction (XRD) patterns were collected with a Shimadzu XRD-7000 instrument at a scan rate of 0.02°·S⁻¹ with a 2θ range of 20°–80° and Cu Κα radiation (λ = 0.1542 nm). XPS spectra were obtained via an Escalab 250 Xi spectrometer (Thermo Fisher Scientific Inc., Waltham, MA, USA) with a monochromated source of X-rays (Al Kα, 1486.6 photo energy) as the excitation source. SEM measurements were conducted on a TESCAN MIRA LMS microscope equipped with energy-dispersive X-ray spectrometry (Xplore 30, Oxford, UK). The thermal behavior analyses were conducted in an N₂ atmosphere between room temperature and 800°C at a rate of 10 °C·min⁻¹ using a Q50 thermogravimetric analyzer (TA Instruments- Waters LLC, New Castle, DE, USA). The magnetic properties of the samples were measured using a LakeShore 7404S vibrational sample magnetometer (Lake Shore Cryotronics, Inc., Westerville, OH, USA). The thermal behavior analyses were conducted in an N₂ atmosphere between room temperature and 800°C at a rate of 10 °C·min⁻¹ using a Q50 thermogravimetric analyzer (TA Instruments- Waters LLC, New Castle, DE, USA).

The morphology of the material was viewed via scanning electron microscopy (SEM) using a Tescan MIRA LMS microscope (Brno, Czech Republic). X-ray diffraction (XRD) was performed to study the crystal structure of the adsorbent using a Rigaku SmartLab SE X-ray diffractometer (Tokyo, Japan) with a scanning angle from 5° to 80° and a scanning speed of 5° min⁻¹. The surface elements of the sample and the functional group distribution of the adsorbent were investigated via X-ray photoelectron spectroscopy (XPS) using a Thermo Fisher ESCALAB 250Xi spectrometer (Waltham, MA, USA). The vacuum of the analysis chamber was 4 × l0⁻⁹ mbar, the excitation source was Al k (hv = 1486.6 eV), the operating voltage was 14.6 kV, the filament current was 13.5 mA, and the signal was accumulated for 20 cycles. The test through-energy (Passing-Energy) was 20 eV in steps of 0.1 eV.

The Fourier transform infrared (FTIR) spectra were monitored by employing a VERTEX 70 spectrometer (Bruker, Germany). The materials were grounded with KBr (1:100) and then compressed to form tables. The X-ray diffraction (XRD) patterns were collected with a Shimadzu XRD-7000 instrument at a scan rate of 0.02°·S⁻¹ with a 2θ range of 20°–80° and Cu Κα radiation (λ = 0.1542 nm). XPS spectra were obtained via an Escalab 250 Xi spectrometer (Thermo Fisher Scientific Inc., Waltham, MA, USA) with a monochromated source of X-rays (Al Kα, 1486.6 photo energy) as the excitation source. SEM measurements were conducted on a TESCAN MIRA LMS microscope equipped with energy-dispersive X-ray spectrometry (Xplore 30, Oxford, UK). The thermal behavior analyses were conducted in an N₂ atmosphere between room temperature and 800°C at a rate of 10 °C·min⁻¹ using a Q50 thermogravimetric analyzer (TA Instruments- Waters LLC, New Castle, DE, USA). The magnetic properties of the samples were measured using a LakeShore 7404S vibrational sample magnetometer (Lake Shore Cryotronics, Inc., Westerville, OH, USA). The thermal behavior analyses were conducted in an N₂ atmosphere between room temperature and 800°C at a rate of 10 °C·min⁻¹ using a Q50 thermogravimetric analyzer (TA Instruments- Waters LLC, New Castle, DE, USA).