Phenom xl
The Phenom XL is a desktop scanning electron microscope (SEM) designed for high-performance imaging and analysis of a wide range of samples. It provides high-resolution imaging with a large field of view and advanced features for easy operation.
Lab products found in correlation
54 protocols using phenom xl
Particle Morphology Imaging via SEM
Preparation and Imaging of Insect Labia
Characterizing Peptide-Iron Chelation
Microparticle Size and Morphology Analysis
Particle size distribution was defined by the sieve method: about 80 g of microparticles were put to the top of a series of sieves (1 mm, 710 and 500 µm) arranged in decreasing size apertures from top to bottom. The stack of sieves was vibrated, the amount of sample retained on each sieve was weighed and the particle size distribution curve was constructed.
Moreover, morphological evaluation of the sample surface and of the internal cross-section was carried out by scanning electron microscopy (Phenom XL, Thermo-Fischer Scientific, Waltham, MA, USA). Before analysis, which was carried out at 15 kV voltage, samples were sputter-coated with gold.
Microstructure and Composition Analysis
Microstructure and Composition Analysis of Samples
Membrane Surface Characterization
Chitosan-based Sponge Microstructure
Characterizing Cell Morphology via SEM
The base H and W values were used to calculate the cel/whole surface area (SA)—Equation (9).
Electrospun PLA Filter Morphology
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