Multimode afm
The Multimode AFM is a versatile scanning probe microscope capable of imaging and characterizing a wide range of samples at the nanoscale. It utilizes atomic force microscopy (AFM) technology to provide high-resolution topographical and material property information.
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12 protocols using multimode afm
Characterization of DDR2-Collagen Interaction
Atomic Force Microscopy of Protein Adsorption
Synthesis of Prussian Blue Nanoparticles
Tapping Mode AFM Imaging
Atomic Force Microscopy Imaging of Biomolecules
Atomic Force Microscopy Analysis of Corneocytes
Topographic cell-surface data were analyzed with the nAnostic method, applying custom-built proprietary algorithms (Serend-ip GmbH, Munster, Germany). The principle of this method has been described elsewhere.22 (link) Briefly, each nanostructure protruding from the mean surface level was morphometrically evaluated. These objects were then filtered by size and shape through computer vision. At this stage, only structures of positive local deviational volume smaller than 500 nm in height and with an area of less than 1 μm2 were considered. The DTI score is the count of identified objects per image (a mean value from 10 randomly recorded images).
Characterization of Aβ Oligomer Morphology
Atomic Force Microscopy Imaging of Biomolecules
Quantitative Topography of Chemically Fixed Cells by AFM
Eu-psa-10 Particle Characterization by AFM
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