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Field emission scanning electron microscope

Manufactured by TESCAN
Sourced in Czechia

The Field Emission Scanning Electron Microscope (FE-SEM) is an advanced imaging tool that uses a focused beam of high-energy electrons to produce detailed, high-resolution images of a sample's surface. The FE-SEM generates images by scanning the sample with the electron beam and detecting the signals that are emitted, providing information about the sample's topography, composition, and other characteristics.

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5 protocols using field emission scanning electron microscope

1

Characterization of n-HA/Fe2O3/PVA Hydrogel

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The n-HA/Fe2O3/PVA composite hydrogel was frozen
and dried. Next, after metal spraying, scanning analysis of the surface
and cross section of the n-HA/Fe2O3/PVA composite
hydrogel were conducted. The microscopic morphology of the n-HA/Fe2O3/PVA composite hydrogel was observed and analyzed
using a TESCAN (Czech Republic) field emission scanning electron microscope.
We acquired secondary electron images and backscattered electron images.
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2

Fibrin Clot Formation and Ultrastructural Analysis

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Fibrin clots were induced to form directly in a microwell plate by addition of 1 μL human thrombin (3 NIH U/mL final concentration) to 33 μL plasma from either the patient or a healthy donor, and the clotting mixture was incubated at room temperature for 120 minutes. The clots were washed 3 times with 0.1 mol/L PBS (pH 7.4) and fixed with 3% glutaraldehyde in the same buffer for 4°C overnight, then dehydrated in a graded series of ethanol solutions (50%, 70%, 80%, 90%, and 100% concentrations) twice. After the 100% ethanol step, samples were immersed in hexamethyldisilazane 3 times, followed by air-drying overnight in a fume hood. The clots were mounted on aluminum stubs and sputter-coated with 10 nm gold. Fibrin clots were examined on field emission scanning electron microscope (Tescan, Brno, Czech Republic), as described previously.[5 (link)]
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3

Preparation and Characterization of PLLA/n-HA Scaffold

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The three-dimensional porous PLLA/n-HA composite scaffold was prepared by brittle fracture under low temperatures and coated with gold for SEM imaging. The microstructure of the sample was then observed by a field emission scanning electron microscope (Tescan, Czech) provided by the Research Institute of Tsinghua University in Shenzhen Micro/Nano Engineering Key Lab.
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4

Comprehensive Characterization of Nanocomposite Materials

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FTIR spectra were obtained with a Shimadzu-8400S (Japan) spectrometer in the wavenumber range of 400–4000 cm−1; an X-ray diffractometer (Philips X-Pert 8440) with Cr Kα radiation (λ = 2.289 Å) was employed for X-ray diffraction (XRD) analysis of the powder samples. The shapes and morphologies of the samples were perceived by a MIRA3 TESCAN field emission scanning electron microscope (FESEM) armed with a link energy-dispersive X-ray (EDX) analyzer. BET measurements were performed to determine the specific surface areas and porosities of the samples with N2 adsorption measurements at 77 K using a BELSORP Mini instrument. The samples were degassed at 180 °C prior to the nitrogen adsorption measurements. An adsorption isotherm was considered to determine the pore size distribution by the Barrett–Joyner–Halenda (BJH) method. A Raman microscope (Senterra 2009, Germany) equipped with a laser wavelength of 758 nm was employed to obtain the Raman spectra. The adsorption mechanisms of the dyes were investigated at room temperature on a Varian Cary 100 spectrophotometer. The content of P2Mo18 in the nanocomposite was determined by inductively coupled plasma atomic emission spectroscopy (ICP-AES, model OEC-730).
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5

Carbonized Precursor Characterization

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All materials were purchased from Merck and Sigma-Aldrich companies and applied without further purification. The ultrasonic bath was used by Becker vCLEAN company. The furnace from the Exciton Company was used to carbonize carbon precursors. FT-IR, 13C-NMR, and 1H-NMR spectra were taken by Shimadzu Fourier and Varian INOVA 500 MHz spectrum. The 9100 electrothermal devices were used for measuring melting points. The electron images were obtained by TE-SCAN Field Emission Scanning Electron Microscope. TESCAN VEGA//XMU, Philips PW1730, micromeritics ASAP 2020, STA6000, performed the EDX, XRD, BET, and TGA analyses.
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