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Phi trift 5 nanotof instrument

Manufactured by Physical Electronics
Sourced in United States

The PHI TRIFT V nanoTOF instrument is a high-performance time-of-flight secondary ion mass spectrometer (TOF-SIMS) designed for nanoscale surface analysis. The instrument utilizes a focused primary ion beam to generate secondary ions from the sample surface, which are then detected and analyzed by the time-of-flight mass spectrometer.

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3 protocols using phi trift 5 nanotof instrument

1

Peptide Orientation Analysis via ToF-SIMS

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To evaluate the orientation of the immobilized peptide on the RFPP-coated surfaces, ToF-SIMS measurements were performed using a Physical Electronics Inc. PHI TRIFT V nanoTOF instrument. A pulsed primary 79Au+ ion beam (30 keV) was used for the ionization of species. Dual charge neutralization was achieved using a PHI system by applying a combination of low energy argon ions (10 eV) and electrons (25 eV). The base pressure was 5×10−4 Pa or less during the measurements. The spectra were collected in bunched instrument settings to optimize mass resolution. Positive SIMS data were acquired over areas of 100 µm×100 µm for an acquisition time of 60 s. For each sample, six spectra were recorded at different locations to assess repeatability. Species associated with protein secondary ion fragments62 (link) were selected, and the counts were normalized to the total intensity of all selected peaks. Acquired data were processed and integrated using WincadenceN software (Physical Electronics Inc. Chanhassen, MN, USA). Error bars for ToF-SIMS represent the 95% confidence interval calculated from the six recorded spectra.
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2

ToF-SIMS Imaging of Antibiotic Powders

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Time-of-flight secondary ion mass spectrometry (ToF-SIMS) experiments were performed using a PHI TRIFT V nanoTOF instrument (Physical Electronics Inc., Chanhassen, MN, USA) equipped with a pulsed liquid metal 79+Au primary ion gun (LMIG), operating at 30 keV energy. Dual charge neutralization was provided by an electron flood gun and 10 eV Ar+ ions. Spatial resolution was optimized for the collection of images by utilizing “unbunched” Au1 instrument settings. Raw data were collected in positive SIMS mode at a number of locations, typically using a 50 × 50 micron raster area, with 4 minute acquisitions (24 (link)).
Analysis of colistin and rifampicin standards identified characteristic peak fragments for use in mapping the components in the combination powders. Peaks corresponding to the protonated molecular ion signal for each antibiotic were of low intensity; hence higher intensity characteristic fragments were used instead. For colistin, the sum of peaks at m/z ~ 30 atomic mass unit (amu) and ~86 amu were selected, corresponding to CH4N+ and C5H12N+ fragments respectively. For azithromycin, the desosamine fragment at m/z ~ 158 amu (C8H16NO2+) and further fragment at m/z ~ 98 amu (C6H12N+) were selected. Sample spectra and images were processed using WincadenceN software (Physical Electronics Inc., Chanhassen, MN, USA).
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3

ToF-SIMS Characterization of Plasma-Coated Particles

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ToF-SIMS was performed to characterize the chemistry of the plasma-coated particles using a PHI TRIFT V nanoTOF instrument (Physical Electronics Inc., Chanhassen, MN, USA) equipped with a pulsed liquid metal Au primary ion gun (LMIG) operated at 30 kV in a bunched Au+ mode to optimize mass resolution. All spectra were analyzed using WincadenceN1 software (Ver. 1.8.1.3 Physical Electronics Inc.) and further studied using NESAC/BIO ToolBox developed at the University of Washington (Seattle, WA, USA) by Dan Graham.
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