Phi trift 5 nanotof instrument
The PHI TRIFT V nanoTOF instrument is a high-performance time-of-flight secondary ion mass spectrometer (TOF-SIMS) designed for nanoscale surface analysis. The instrument utilizes a focused primary ion beam to generate secondary ions from the sample surface, which are then detected and analyzed by the time-of-flight mass spectrometer.
Lab products found in correlation
3 protocols using phi trift 5 nanotof instrument
Peptide Orientation Analysis via ToF-SIMS
ToF-SIMS Imaging of Antibiotic Powders
ToF-SIMS Characterization of Plasma-Coated Particles
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