Quantax edx xflash

SEM-EDX analysis was performed at room temperature using a scanning electron microscope (VEGAS 3 SBU, Tescan, Brno-Kohoutovice, Czech Republic) with a Quantax EDX XFlash (Bruker, Karlsruhe, Germany) detector. Samples of ~4 mm² were mounted with carbon tape on an SEM stub.

The XRD patterns were recorded using a D8 Advance diffractometer (Bruker, Karlsruhe, Germany) with Ni-filtered CuK α1 radiation of λ = 1.54060 Å wavelength, operating at 40 kV and 40 mA, at room temperature. The degree of crystallinity was determined as the ratio between the area of diffraction peaks and the total area of diffraction peaks and halos.
SEM-EDX scanning electron microscope measurements were performed on small samples at the age of 480 days. The SEM-EDX analysis was performed at room temperature using a scanning electronic microscope (VEGAS 3 SBU, Tescan, Brno-Kohoutovice, Czech Republic) with a Quantax EDX XFlash (Bruker, Karlsruhe, Germany) detector. Samples of ~4 mm² were mounted with carbon tape on an SEM stub. For each composite, XRD-SEM-EDX measurements were performed on a single sample.