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Jes x320

Manufactured by JEOL
Sourced in Japan

The JES-X320 is an Electron Spin Resonance (ESR) spectrometer designed for the analysis of paramagnetic species. It features a high-frequency microwave bridge, a temperature control system, and a user-friendly software interface. The JES-X320 provides accurate and reliable measurements of g-factors, line widths, and spin concentrations.

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7 protocols using jes x320

1

Thermal Analysis of Viologen-Modified Glutamide Derivatives

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All chemicals were of reagent grade and were purchased from chemical suppliers (Tokyo Chemical Industry Co., Ltd., FUJIFILM Wako Pure Chemical Corp., and Sigma-Aldrich, Inc.). The NMR spectra, UV-visible (UV-vis) spectra, circular dichroism (CD) spectra, and electron paramagnetic resonance (EPR) spectra were measured using JNM-EX400 (JEOL, Tokyo, Japan), V-560 (JASCO, Tokyo, Japan), J-725 (JASCO, Tokyo, Japan), and JES-X320 (JEOL, Tokyo, Japan) spectrometers, respectively. Transmission electron microscopy (TEM) was conducted using a JEM-1400 Plus microscope (JEOL, Tokyo, Japan). Differential scanning calorimetry (DSC) thermograms (Fig. S1) were obtained using a DSC 6200 differential scanning calorimeter (Seiko Instruments Inc., Chiba, Japan). An aqueous solution of viologen-modified glutamide (G) derivatives, G-V2+, (20 mM, 50 μL; Fig. 2a), was sealed in 70 μL silver pans and scanned between 5 and 90 °C at a heating and cooling rate of 2 °C min−1 under a N2 atmosphere (50 mL min−1).
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2

EPR Analysis of Reduced G-V2+ Complex

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EPR spectra were measured with an aqueous sample cell (LC12; flat type, 10 mm width × 0.25 mm thickness) in the solution state at 20 °C using an EPR spectrometer (JES-X320, JEOL RESONANCE Inc.). An aqueous G-V2+ solution (0.5 mM) was reduced using sodium dithionite (0.6 mM) under an Ar atmosphere in a glove box (MF-100, UNICO Inc.), and was moved into the aforementioned EPR cell for measurement. The EPR spectrum of the G-V2+ solution after reduction was analyzed, and the g-factor (dimensionless magnetic moment) was calculated using a software attached to the EPR spectrometer.
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3

Hydroxyl Radical Detection by DMPO Assay

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For 5,5‐dimethyl‐1‐pyrroline‐N‐oxide (DMPO) assay, DMPO is used as a trapping agent for ·OH. DMPO with Fe‐GA CPNs, H2O2, and Fe2+ were mixed. After 30 s, the characteristic peak of DMPO that captured hydroxyl radicals was measured by the ESR spectrometer (JEOL Corporation JES‐X320).
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4

Chromatographic and Spectroscopic Characterization of Organic Compounds

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The reaction progress was monitored using thin-layer chromatography (TLC) on silica gel 60 F254 (0.25 mm, Merck, Darmstadt, Germany). Column chromatography was performed using silica gel 60 (0.04–0.063 mm, Merck). Melting points were determined using a Yanaco (Tokyo, Japan) micro-melting point apparatus without correction. The LC system used was equipped with an LC-6 AD pump (Shimadzu, Kyoto, Japan), a UVDEC-100 V spectrometric detector (JASCO, Tokyo, Japan), a YRD-880 IR detector (Shimamura Tech. Co. Ltd., Tokyo, Japan), or a SPD-20A (Shimadzu), and a Capcell pack RP-18 column (Shiseido, Tokyo, Japan). NMR spectra were recorded with a JEOL JNM-LA400 spectrometer (Tokyo, Japan). The chemical shifts were expressed as ppm downfield from TMS. The mass spectra were measured on a JEOL JMS-SX102A mass spectrometer. The ESR spectra were collected on a JEOL JES-X320.
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5

Advanced Characterization of Porous Materials

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The QuadraSorb SI is used in order to analyze the specific surface area, pore size, and CO2 adsorption quantity. UV–vis diffuse reflection absorption spectra of samples are obtained by the UV2600 spectrophotometer equipped with an integrating sphere accessory and Teflon as a reference material. The morphologies and microstructures are inspected by transmission electron microscopy (TEM, HT-7700, accelerating voltage 100 kV) and scanning electron microscope (FE-SEM, ZEISS SUPRATM 55). Elemental characterization including HAADF and EDS images are carried out by using STEM (FEI Tecnai G2 TF20). Powder X-ray diffraction (PXRD) is recorded using a Bruker D8 DISCOVER X-ray power diffractometer. Time-resolved fluorescence decay is measured by time-correlated-single photon counting (Edinburgh Instruments, FLS 920). Electron paramagnetic resonance (EPR) signals are recorded using JEOL JES-X320. Photoluminescence (PL) measurements are performed at room temperature using a F-320 fluorescence spectrophotometer.
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6

Quantitative EPR Analysis of DTBDTCN

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A quartz ESR tube containing DTBDTCN powder (2.0 mg, 1.923 × 10−6 mol) was evacuated for 4 h, and then flame sealed. VT‐ESR measurements of DTBDTCN were performed on an ESR spectrometer (JES‐X320, JEOL) equipped with a variable temperature controller (ES‐13060DVT5, JEOL). A TEMPOL solution (3.309 × 10−6m) in anhydrous toluene with the spin number of 1.094 × 1015 was used as a standard sample. The integration of the ESR signals was calibrated with Mn marker peaks. The double integral of the DTBDTCN signal at variable temperatures relative to the TEMPOL signal was used to quantify the spin concentrations in DTBDTCN. Fitting of the VT ESR data was performed with the Bleaney‐Bowers equation reported in the literature.[58] The ESR sample of DTTTCN was prepared and measured with the same methods as those for DTBDTCN.
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7

Structural Characterization of Materials

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Low-magnification transmission electron microscopy (TEM) was performed on a HITACHI HT7700 at 120 kV. High-angle annular dark-field scanning transmission electron microscopy (HAADF-STEM) and HRTEM was recorded on a FEI Talos F200X S/TEM with a field-emission gun at 200 kV. ESR spectra were collected on JEOL JES-X320. XPS was performed on SSI S-Probe XPS Spectrometer. Powder X-ray diffraction (PXRD) patterns were collected on X’Pert-Pro MPD diffractometer (Netherlands PANalytical) with a Cu Kα X-ray source (λ = 1.540598 Å).
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