Uv 3600i plus

The density ρ of the sintered glass parts was measured by the Archimedes principle using a lab scale Quintix 124‐1S and a density kit analytical balance YDK03 (Sartorius AG, Germany). The sintered fused silica parts were weighed in the dry state (m). Afterward, they were immersed in DI water (T = 20.5 °C) with a small amount of surfactant and the buoyancy mass m_b was determined. The density was calculated using following equation, with ρ_H2O being the density of water
$$\rho =\frac{m{\rho }_{{\mathrm{H}}_2\mathrm{O}}}{-m_{\mathrm{b}}}$$
The shrinkage was determined by measuring three different FDM‐printed parts in the green part stage and after sintering with a caliper. The theoretical linear shrinkage Y_s can be calculated in dependence of the solid loading Φ, theoretical density ρ_t, and final density ρ_f of the manufactured object using following equation
$$Y_{\mathrm{s}}=1-{\left(\frac{\mathrm{\Phi }}{{\rho }_{\mathrm{t}}/{\rho }_{\mathrm{f}}}\right)}^{\frac{1}{3}}$$
Optical inline transmission was determined by using a UV–vis spectrometer of type Evolution 201 (Thermo Scientific, Germany) and an FTIR spectrometer of type Frontier 100 MIR‐FTIR (Perkin Elmer, Germany). Total UV–vis transmission and reflectance were measured using a UV–vis–NIR spectrophotometer of type UV‐3600i Plus (Shimadzu, Japan) equipped with an integrating sphere attachment of type ISR‐1503 (Shimadzu, Japan). Fused silica glass slides (2 mm thickness, Toppan Photomasks, Inc., USA) were used as a reference sample for all measurements.

Powder XRD was performed on a Rigaku charge-coupled device (CCD) diffractometer. Electronic spectroscopy was performed on a Shimadzu UV3600IPLUS ultraviolet/visible/near-infrared spectrophotometer. EPR spectroscopy was performed on a Bruker EMX Plus spectrometer operating in the X-band (9.1 GHz) and Q-band (34.0 GHz) frequencies. High-field (∼13.3 T) and high-frequency (∼360 GHz) single-crystal EPR spectroscopy was performed on a terahertz electron spin resonance apparatus. EPR spectra were acquired at selected temperatures with variations in temperature measured using a helium continuous-flow thermostat. Angle-dependent EPR spectra were obtained by rotating a single crystal of o-1·3CH₃CN·H₂O in the plane perpendicular to the ab plane. Electrical conductivity was measured using a helium flow thermostat and temperature-dependent conductivity was determined with a voltage bias of 1.5 V at a ramping rate of 1 K min⁻¹. A single crystal of o-1·3CH₃CN·H₂O fixed on a quartz tube was photographed on a Rigaku XtalAB PRO MM007 DW diffractometer at room temperature. Face indexing was carried out by using the CrysAlisPro 171.40.84a program.

High-resolution SEM images and EDS analyses of the silver nanoclusters were obtained using an environmental SEM (Quattro, ThermoFisher, Waltham, MA, USA). Extinction spectra of plasmonic superstructure arrays were measured using a UV-Vis-NIR spectrophotometer (UV-3600i plus, Shimadzu, Japan). All Raman data were acquired at room temperature using a Raman spectrometer equipped with 633 and 785 nm excitation lasers (NRS-4500, Jasco, Japan) and two gratings (1800 grooves per mm for 633 nm and 1200 grooves per mm for 785 nm). A slit (50 × 8000 μm) was adopted to achieve a resolution of 2.3 cm⁻¹. Before measurements, the spectrometer was calibrated using a standard silicon substrate. The excitation power and exposure time were set at 2.8 mW and 10 s, respectively, for measurement of Rhodamine 6G solution with 2 accumulations. Meanwhile, excitation power and exposure time were set at 1.4 mW and 1 s, respectively, for measurement of crystal violet mixed with PFOA solution with 2 accumulations. The Raman excitation laser was focused using a 50× objective lens with a numerical aperture of 0.5. Each sample was measured 5 times at the same conditions to acquire an averaged spectrum. For data treatment, the baseline function and the peak find function were used to delete the invalid data and to identify Raman peaks, respectively.