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Ntegra spectra system

Manufactured by NT-MDT
Sourced in United States

The NTEGRA Spectra system is a multi-functional scanning probe microscope (SPM) platform that enables high-resolution imaging and spectroscopic analysis of a wide range of materials and samples. The system integrates various SPM modes, including atomic force microscopy (AFM), scanning tunneling microscopy (STM), and near-field scanning optical microscopy (NSOM), allowing users to explore the topography, electrical, and optical properties of their samples.

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6 protocols using ntegra spectra system

1

Comprehensive Characterization of GDY

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The X-Ray photoelectron spectrometer (XPS, ULVAC-PHI) was carried out to investigate the bonding environment and chemical component. The structure characteristic of GDY was analyzed by using Raman spectra (NT-MDT NTEGRA Spectra System). Morphological information was measured using scanning electron microscope (Hitachi S-4800 FESEM). Magnetic moment measurements were recorded using a vibrating sample magnetometer (PPMS-VSM, Quantum Design) with temperature changing from 2 K to 300 K.
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2

Atomic Force Microscopy of Protein Samples

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AFM analysis was conducted using the NTEGRA Spectra system (NT-MDT; Santa Clara, CA, USA). Diluted solutions were allowed to down for 30 s spin coating at 400× g. GAP and GAP × COP protein sample solutions were applied to a freshly cleaved mica surface. To prepare GAP and GAP × COP samples on the functionalized substrate, the surface was ultrasonically washed with ethanol for approximately 1–3 min. to remove surface impurities. Treatment solution was applied to the mica surface and incubated for 15 min. at RT. The droplet was removed from the surface with nitrogen, and the surface was rinsed with water. The samples were analyzed using AFM. All of the measurements were conducted in air under ambient conditions.
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3

Rhodamine 6G SERS Nanoparticle Preparation

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The preparation for surface-enhanced Raman spectroscopy (SERS) measurement was performed by immersing arrays of in-plane shape-different Ag nanoparticles into Rhodamine 6 G aqueous solutions with a concentration of 10-6 M. The immersion procedure was carried out for 4 h to assure that sufficient R6G molecules can be chemisorbed on the surface of Ag nanoparticles, especially the hot spots under electromagnetic excitation (namely, the vertices of triangular nanoparticles). Before measurement, all samples were dipped into DI water for 30 s and dried with nitrogen flow. SERS signals spectra with three main peaks at 1363, 1508, and 1650 cm−1 were collected by the NTEGRA Spectra system (NTMDT) equipped with a laser source of 532-nm wavelength. The measured data were treated with baseline correction to extract SERS spectra from the broad background.
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4

Characterization of Monolayer WS2

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Monolayers of WS2 were first selected through optical microscopy. AFM scans were obtained in a Bruker Dimension Icon operating in tapping mode. Raman spectroscopy and PL were performed in a NT-MDT NTEGRA Spectra system with an excitation laser wavelength of 532 nm with spectral resolutions of 0.5 cm−1 and 10−3 eV, respectively. TEM images and SAED patterns were taken in a JEOL JEM-2010F TEM operating at 200 kV. High-angle annular dark field AC-HRSTEM images were obtained in FEI Titan G2 S/TEM operating at 80 kV. A Gaussian blur filter was applied to the AC-HRSTEM images using ImageJ software in order to reduce contrast from carbon contamination.
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5

Raman Spectroscopy of Crystal Structure

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Raman spectroscopy was performed in ambient atmosphere with a NTEGRA Spectra system from NT-MDT with a laser wavelength of 532 nm, a spot size of 0.6 μm (100× objective), a laser power density of S = 0.3 × 103 kW cm−2, a 600 mm−1 grating and a spectral resolution of 6.5 cm−1. For the Raman spectra a 10 μm × 10 μm area was scanned and a total of 100 measurements were averaged. The analysis of the crystal structure by Raman spectroscopy is shown in Fig. S3 in the ESI.
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6

Atomic Force Microscopy of POx-PTX Solutions

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The AFM scans were obtained with an NT-MDT NTEGRA Spectra system. All scans were performed in tapping mode with standard AFM tips (NSG03/NT-MDT) under ambient conditions. The sample solutions were diluted (100–1000 times) immediately prior to deposition on the freshly cleaved mica surface and incubated for <1 min. Depending on the dilution, the surface was additionally washed with a drop of DI water or dried under an argon atmosphere right away. The stock solutions contained 10 g/L POx and varying concentrations of PTX (0.2–5.0 g/L). The data were processed with the Gwyddion 2.3 freeware.
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