Ntegra spectra system
The NTEGRA Spectra system is a multi-functional scanning probe microscope (SPM) platform that enables high-resolution imaging and spectroscopic analysis of a wide range of materials and samples. The system integrates various SPM modes, including atomic force microscopy (AFM), scanning tunneling microscopy (STM), and near-field scanning optical microscopy (NSOM), allowing users to explore the topography, electrical, and optical properties of their samples.
6 protocols using ntegra spectra system
Comprehensive Characterization of GDY
Atomic Force Microscopy of Protein Samples
Rhodamine 6G SERS Nanoparticle Preparation
Characterization of Monolayer WS2
Raman Spectroscopy of Crystal Structure
Atomic Force Microscopy of POx-PTX Solutions
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