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Nova 200 nano sem

Manufactured by Thermo Fisher Scientific
Sourced in United States

The NOVA 200 Nano SEM is a scanning electron microscope designed for high-resolution imaging of nanoscale structures. It utilizes a field emission gun to generate a focused electron beam, enabling detailed analysis of samples at the nanometer scale.

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33 protocols using nova 200 nano sem

1

Characterizing Hydrogel Morphology and Composition

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The morphology of the hydrogels was detected by scanning electron microscopy (SEM, Nova 200 NanoSEM, FEI, USA). Ca2+ atomic content and distribution of Gel and Gel + FGF21 were quantified by energy dispersive spectrometer (EDS) (Nova 200 NanoSEM, FEI, US). The chemical structure of hydrogels was detected by fourier transform infrared spectroscopy (FITR, Thermo, NICOLET is20).
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2

Scanning Electron Microscopy of Cementitious Composites

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To examine the microstructural attributes—including aspects such as form, dimensions, surface quality, and microscopic voids—a scanning electron microscopy (SEM-FEG, Nano SEM NOVA 200, FEI)investigation was undertaken on self-sensing cementitious composites. Within this experimental context, secondary electrons generated by an electron beam were directed onto the specimen’s surface, yielding three-dimensional visual representations. It is important to emphasize that specimens subjected to SEM analysis must undergo thorough drying prior to examination.
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3

Biofunctionalized Nanofiber Morphology Analysis

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SEM was used to analyse the morphology of biofunctionalized NFMs. Briefly, the biofunctionalized NFMs were sputter-coated with a thin layer (9–12 nm) of gold/palladium (Cressington 208 HR) and then analysed by SEM (NanoSEM, Nova 200, FEI company, Hillsboro, OR, USA). Micrographs were recorded at 15 kV with magnifications ranging from 100 to 2000 times.
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4

Characterizing BC Composites Surface

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BC composites were coated with a thin layer of gold–palladium. Analyses of the surface morphology and cross section of these composites were done using an ultra‐high‐resolution field emission gun SEM instrument (NOVA 200 Nano SEM; FEI, Hillsboro, OR, USA).
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5

FESEM Analysis of GNP-Ecocomposite Dispersion

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In order to study the impregnation and the degree of dispersion of the GNPs into the ecocomposites, FESEM analysis was used. The surface morphology and cross sections of the samples was analyzed by FESEM using the NOVA 200 Nano SEM equipment from FEI Company (Hillsboro, OR, USA). All samples were coated with a palladium-gold (Pd-Au) film (20 nm) to make them conductive.
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6

FESEM Analysis of Textile Substrate Impregnation

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In order to study the impregnation and the GNP’s degree of dispersion in the textile substrates, an FESEM analysis was carried out. The surface morphology of the samples was analysed by FESEM using the NOVA 200 Nano SEM equipment from FEI Company (Hillsboro, OR, USA). All samples were sputter-coated with a palladium-gold (Pd-Au) film (20 nm) to make them conductive. The images were taken in topographic mode with an accelerated voltage of 10 kV, on different scales.
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7

Scanning Electron Microscopy Analysis of PC-Coated Fabrics

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Morphological analyses of the PC-coated fabrics were carried out by scanning electron microscopy with an ultra-high resolution field emission gun (FEI NOVA 200 Nano SEM). Before all measurements, the PC-coated fabric samples were covered with a thin film of gold/palladium (80:20) in a 208HR high-resolution sputter coater (Cressington, Watford, UK) coupled to an MTM-20 high-resolution thickness controller (Cressington, Watford, UK).
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8

Scanning Electron Microscopy of Surface Morphology

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Surface morphology
was observed by scanning electron microscopy (SEM) using an ultrahigh-resolution
field emission gun SEM (FEG-SEM, NOVA 200 Nano SEM, FEI Company).
Before analysis, samples were first covered with a very thin film
(5 nm) of Au–Pd (80–20 wt %). Topographic images were
obtained with a secondary electron detector using the following parameters:
an acceleration voltage of 10 kV, a ∼5 mm stage distance, and
10,000 and 50,000 × magnifications.
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9

Morphological Analysis of PVA Architectures

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The morphology of each PVA architecture was analysed by scanning electron microscopy (SEM), an ultra-high resolution field emission gun scanning electron microscopy (FEG-SEM), NOVA 200 Nano SEM, FEI Company (Hillsboro, OR, USA). Secondary electron images were performed at an acceleration voltage of 10 kV. Samples were covered with a thin film (25 nm) of Au-Pd (80–20 weight %), using a high-resolution sputter coater, 208HR Cressington Company (Watford, UK), coupled to an MTM-20 Cressington High-Resolution Thickness Controller.
The braiding angle of each fibrous architecture, a fundamental physical property, was accurately measured from images obtained by SEM, using the ImageJ software.
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10

Fabric Microstructure Analysis via FEG-SEM

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The analysis of fabrics was conducted employing an ultra-high-resolution field emission gun scanning electron microscope (FEG-SEM) system from NOVA 200 Nano SEM, FEI. A 10 kV acceleration voltage was selected in order to acquire secondary electron images. The surfaces of the samples were coated with a 25 nm film of Au-Pd (80–20 weight percent) using a sputter coater of high-resolution (208HR Cressington Company, which was fixed to an MTM-20 Cressington high-resolution thickness controller). An analysis was conducted on the morphology of the HAp layer that was applied to the PVA-braided architectures using the identical SEM technique. Subsequently, the elemental (atomic) compositions of the composite braids were analyzed, which included the Ca/P ratio of HAp. In order to accomplish this, the SEM apparatus utilized energy-dispersive X-ray spectroscopy (EDS) analysis with an EDAX Si (Li) detector and a 5 kV acceleration voltage.
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