Nova 200 nano sem
The NOVA 200 Nano SEM is a scanning electron microscope designed for high-resolution imaging of nanoscale structures. It utilizes a field emission gun to generate a focused electron beam, enabling detailed analysis of samples at the nanometer scale.
Lab products found in correlation
33 protocols using nova 200 nano sem
Characterizing Hydrogel Morphology and Composition
Scanning Electron Microscopy of Cementitious Composites
Biofunctionalized Nanofiber Morphology Analysis
Characterizing BC Composites Surface
FESEM Analysis of GNP-Ecocomposite Dispersion
FESEM Analysis of Textile Substrate Impregnation
Scanning Electron Microscopy Analysis of PC-Coated Fabrics
Scanning Electron Microscopy of Surface Morphology
was observed by scanning electron microscopy (SEM) using an ultrahigh-resolution
field emission gun SEM (FEG-SEM, NOVA 200 Nano SEM, FEI Company).
Before analysis, samples were first covered with a very thin film
(5 nm) of Au–Pd (80–20 wt %). Topographic images were
obtained with a secondary electron detector using the following parameters:
an acceleration voltage of 10 kV, a ∼5 mm stage distance, and
10,000 and 50,000 × magnifications.
Morphological Analysis of PVA Architectures
The braiding angle of each fibrous architecture, a fundamental physical property, was accurately measured from images obtained by SEM, using the ImageJ software.
Fabric Microstructure Analysis via FEG-SEM
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