The UV-Visible absorption spectrum was recorded using a UV-Visible spectrophotometer (UV) (UV-1800; Shimadzu, Tokyo, Japan). A Fourier transform infrared (FTIR) spectrometer (Perkin Elmer, Spectrum 400, Waltham, MA, USA) was used to analyse the chemical bonding of the synthesised nanoparticles and an energy-dispersive X-ray diffraction (EDX) (JCM-6000PLUS, New Delhi, India) system was used to determine the elemental composition of the TiO2 nanoparticles. Characteristic peaks were observed by X-ray diffraction detector (XRD) (Bruker D8 Advance XRD diffractometer, Bruker, Karlsruhe, Germany), the size and the morphology of the TiO2 nanoparticles were determined by using scanning electron microscope (SEM) (JCM-6000PLUS, New Delhi, India), d-spacing between the particles was carried out by using high-resolution transmission electron microscopy (HR-TEM) (Jeol/JEM 2100, JEOL Inc., Peabody, MA, USA) and dynamic light scattering (DLS) and zeta potential were carried out by using Malvern Zetasizer (Malvern, Worcestershire, UK, WR14 1XZ).
Xrd d8 advance diffractometer
Manufactured by Bruker
Sourced in Germany
The XRD D8 Advance diffractometer is a versatile X-ray diffraction (XRD) instrument designed for a wide range of materials analysis applications. It is capable of performing high-resolution X-ray diffraction measurements to characterize the structural properties of various materials, including crystalline solids, thin films, and powders.
Automatically generated - may contain errors
Lab products found in correlation
Jcm 6000plus, by JEOL (2 mentions)
Jem 2100, by JEOL (2 mentions)
Spectrum 400, by PerkinElmer (1 mentions)
Zetasizer, by Malvern Panalytical (1 mentions)
Uv 1800, by Shimadzu (1 mentions)
V 670 uv vis nir spectrometer, by Jasco (1 mentions)
Thermo nicolet is50, by Thermo Fisher Scientific (1 mentions)
Jcm 6000plus, by Thermo Fisher Scientific (1 mentions)
Tecnai g2 f20, by Hitachi (1 mentions)
Aa 6880, by Shimadzu (1 mentions)
S 4800, by Hitachi (1 mentions)
Uv 2550, by Shimadzu (1 mentions)
Ft ir 6000 fourier transform spectrometer, by Jasco (1 mentions)
Nano zs90, by Malvern Panalytical (1 mentions)
Jem 1230 microscope, by JEOL (1 mentions)
Nicolet is10, by Thermo Fisher Scientific (1 mentions)
7 protocols using xrd d8 advance diffractometer
1
Characterization of TiO2 Nanoparticles
2
Characterization of TAFEMgO Nanoparticles
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TAFEMgO NPs were identified and characterized by employing various chemical and spectroscopic techniques, such as UV–Visible spectrophotometer (Jasco v-670 UV-VIS-NIR spectrometer, Tokyo, Japan) from the wavelength of 200 to 850 nm, energy-dispersive X-ray diffraction (JCM-6000PLUS, New Delhi, India), FTIR spectroscopy (Thermo Nicolet Is 50- Thermo Fisher, Waltham, MA, USA) using the wave number 400–4500 cm−1, scanning electron microscopy (JCM-6000PLUS, New Delhi, India), transmission electron microscope (Jeol/JEM 2100, JEOL, Peabody, MA, USA), selective area electron diffraction, and X-ray diffraction detector (Bruker D8 Advance XRD diffractometer, Bruker, Karlsruhe, Germany) using the standardized procedure.
3
Silk Fiber Crystallinity Analysis by XRD
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Wide-angle XRD measurements were performed on a D8-Advance XRD diffractometer (Bruker, Karlsruhe, Germany) at a scan rate of 4° 2θ min−1 from 10° to 40° with Cu Kα radiation. The irradiation conditions of the X-ray generator system were 40 kV and 30 mA. The crystallinity of silk fiber was calculated from the area ratio between the crystalline and amorphous regions of 2θ diffractograms using the MDI Jade 6.0 software (Jade 6.0, MDI, Livermore, CA, USA).
4
Characterization of Pyrolysis-Derived Catalysts
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XRD patterns of the pyrolysis products were recorded using a Bruker D8 Advance XRD diffractometer (Cu Kα, 40 kV and 40 mA, λ = 1.5406 Å). The BET measurements were performed and the pore-size distribution was evaluated using a Quantachrome Autosorb 1-C adsorption instrument. The morphology of the sample surface was observed by TEM (FEI Tecnai G2 F20) and FE-SEM (S4800 HITACHI). An X-ray photoelectron spectrometer (Thermo Scientific 250Xi, Al Ka, hν = 1486.6 eV, 15 kV and, 10 mA) was used for the determination of the chemical states of the surface Cr and Fe elements. The Cr(vi ) concentration was detected using a UV-Vis spectrophotometer (Shimadzu UV2550). Total Fe content in nZVI/BC was analysed by an atomic absorption spectrometer (Shimadzu AA6880).
5
XRD and FTIR Analysis for Quantitative Mineralogy
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X-ray diffraction analysis
was conducted with a Bruker XRD D8 advance diffractometer equipped
with a ceramic tube, X-ray source, a monochromator, an automatic variable
divergent slit, and a 1.0 mm detector slit. The step size for the
increment of the angle theta was 0.01 °C. It has wide applications
including phase identification, quantitative phase analysis, and microdiffraction.
Samples for XRD measurements were carefully ground rock powders or
fine size fractions separated by centrifugation or gravity settling.
Ideally, the concentration of the mineral phases of interest should
be more than several percent. If not, it will be difficult to accurately
identify the interesting phase.
The shale powders heated at
various temperatures were analyzed by a Nicolet iS50 infrared spectrometer.
FTIR spectra were collected in the mid-IR range (4000–400 cm–1) for all shale samples with 4 cm–1 resolution (2 cm–1 steps). Therefore, there are
a total of 1801 data points for each spectrum from 4000 to 400 cm–1.
was conducted with a Bruker XRD D8 advance diffractometer equipped
with a ceramic tube, X-ray source, a monochromator, an automatic variable
divergent slit, and a 1.0 mm detector slit. The step size for the
increment of the angle theta was 0.01 °C. It has wide applications
including phase identification, quantitative phase analysis, and microdiffraction.
Samples for XRD measurements were carefully ground rock powders or
fine size fractions separated by centrifugation or gravity settling.
Ideally, the concentration of the mineral phases of interest should
be more than several percent. If not, it will be difficult to accurately
identify the interesting phase.
The shale powders heated at
various temperatures were analyzed by a Nicolet iS50 infrared spectrometer.
FTIR spectra were collected in the mid-IR range (4000–400 cm–1) for all shale samples with 4 cm–1 resolution (2 cm–1 steps). Therefore, there are
a total of 1801 data points for each spectrum from 4000 to 400 cm–1.
6
Physicochemical Characterization of LSPE/SBA-15 and LDPE/TEO@SBA-15 Films
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The experimental conditions used for the physicochemical characterization of all LSPE/xSBA-15 and LDPE/xTEO@SBA-15 films are described in detail in previous recent publications [21 (link),23 (link),24 (link)]. Briefly, a Bruker XRD D8 Advance diffractometer, Bruker GmbH, Mannheim, Germany was employed to carry out XRD analysis to all films i.e., LDPE/xSBA-15, LDPE/xTEO@SBA-15, and the pure LDPE films, to define the crystal structures of the resulted materials. The interactions between the incorporated SBA-15 and TEO@SBA-15 nanostructures with the LDPE polymeric matrix were studied using an FT/IR-6000 JASCO Fourier-transform spectrometer, JASCO company, Easton, MD, USA.
7
Comprehensive Nanoparticle Characterization Protocols
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The morphology of the samples was examined using transmission electron microscopy (TEM; JEOL JEM-1230 microscopes at 80 kV, JEM-1230, Japan). For TEM characterization, nanoparticle suspension was air-dried on gold grids. The ζ-potentials, intensity size distribution, and PDI of the nanoparticle were measured in Milli-Q water on a Zetasizer Nano-ZS90 instrument (Malvern Instrument, U.K.). UV-vis absorption measurements were carried out on a Cary 50 UVVIS-NIR spectrophotometer. Structural properties of the samples were also studied by X-Ray diffraction (XRD) using a Bruker XRD D8 Advance diffractometer in Bragg Brentano configuration for powders and a sweeping from 20 to 80. Thermogravimetric analysis (TGA) was performed on a Discovery TGA 55 instrument (TA Instruments, New Castle, USA). The functional groups of the samples were analyzed using a Fourier transform infrared spectrometer (FTIR) (Nicolet iS10, Thermo Fisher Scientific, USA) in the wavenumber range of 400–4000 cm− 1. The obtained samples were characterized using ICP-OES (Agilent 725, USA).
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