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New d8 advance x ray diffractometer

Manufactured by Bruker
Sourced in United States

The New D8-advance X-ray diffractometer is a versatile laboratory instrument designed for the analysis of crystalline materials. It utilizes X-ray diffraction technology to provide detailed information about the structure and composition of various solid-state samples. The core function of this equipment is to accurately measure and analyze the diffraction patterns generated by the interaction of X-rays with the atoms in the crystal lattice of the sample material.

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3 protocols using new d8 advance x ray diffractometer

1

Characterization of Graphene-based Hybrid Structures

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The microstructures of the hybrid structures based on graphene sheets are characterized by scanning electron microscope (SEM) images and EDS spectra, taken with a Carl Zeiss SUPRA 55VP FE-SEM. For revealing the compositions of the hybrid structures, X-ray diffraction(XRD) analysis was performed on a Bruker New D8-advance X-ray diffractometer equipped with Ge-monochromatized Cu Kα radiation (λ = 1.5418 Å). For Fourier transform infrared spectrometry (Thermo Scientific Nicolet 670), GO, EDTA-GO and EDTA-rGO were scanned from 500 to 4000 cm−1 in forms of buckypaper. Contact angle of GO, rGO, EDTA-GO and EDTA-rGO layer on PTFE filter was measured with KRÜSS DSA 100 instrument. Conductivity of ion solutions (MgCl2, NaCl and KCl solutions) before and after filtration for permeation rate was measured with Mettler Toledo SevenCompactTM conductivity meter. The concentration of positive and negative ions into the solution was measured with Shimdzu JP/ICPS-750 (inductively coupled plasma, ICP) and Dionex ICS-3000(Ion chromatograph, IC), respectively.
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2

Characterization of Colorful Electrochromic Materials

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Basic blue 7, basic blue 26, ethyl violet, lithium bis(trifluoromethanesulfonyl)imide, and lithium bis(oxalato)borate were purchased from TCI. Propylene glycol methyl ether acetate was purchased from Sigma-Aldrich. Methylene chloride, chloroform, and other chemical solvents were purchased from Samchun Pure Chemical. All chemicals were used without any additional purification. Transparent glass substrates were provided by Paul Marienfeld GmbH & Co.KG and acrylic binder was supplied by Alphachem Corporation.
Absorption and transmittance spectra were measured using a Perkin Elmer Lambda 25 UV/Vis spectrophotometer. Chromatic characteristics of the color films were analyzed on a Scinco color spectrophotometer. X-ray diffraction patterns were measured using Bruker New D8 Advance X-Ray Diffractometer. 1H and 13C Nuclear Magnetic Resonance (NMR) spectra were recorded on a Bruker Avance 500 spectrometer running at 500 MHz using chloroform-d as a solvent with TMS as an internal standard. Mass spectra were obtained using an LCQ Fleet mass spectrometer with high resolution.
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3

Comprehensive Material Characterization

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The X-ray diffraction
(XRD) pattern was recorded with a New D8 Advance X-ray diffractometer
(Bruker, USA) using Cu Kα radiation. Fourier-transform infrared
(FT-IR) spectra were acquired on a Nicolet iS10 IR spectrophotometer
(Thermo Fisher Scientific, USA) with the sample in potassium bromide
pellets. Thermogravimetric analysis (TGA) was conducted using a Q500
system (TA Instruments, USA) at a scan rate of 5 °C min–1 under an air atmosphere. The nitrogen adsorption–desorption
isotherm was obtained using a 3Flex surface characterization analyzer
(Micromeritics, USA) at −196 °C. The sample was vacuum-dried
at 100 °C overnight prior to analysis. Field-emission scanning
electron microscopy (FE-SEM) photographs were obtained on a SUPRA
55VP field-emission scanning electron microscope (Zeiss, Germany).
Zeta potential was evaluated using a Z-1000 electrophoretic light
scattering spectrophotometer (ELS, Otsuka Electronics, Japan).
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