New d8 advance x ray diffractometer
The New D8-advance X-ray diffractometer is a versatile laboratory instrument designed for the analysis of crystalline materials. It utilizes X-ray diffraction technology to provide detailed information about the structure and composition of various solid-state samples. The core function of this equipment is to accurately measure and analyze the diffraction patterns generated by the interaction of X-rays with the atoms in the crystal lattice of the sample material.
Lab products found in correlation
3 protocols using new d8 advance x ray diffractometer
Characterization of Graphene-based Hybrid Structures
Characterization of Colorful Electrochromic Materials
Absorption and transmittance spectra were measured using a Perkin Elmer Lambda 25 UV/Vis spectrophotometer. Chromatic characteristics of the color films were analyzed on a Scinco color spectrophotometer. X-ray diffraction patterns were measured using Bruker New D8 Advance X-Ray Diffractometer. 1H and 13C Nuclear Magnetic Resonance (NMR) spectra were recorded on a Bruker Avance 500 spectrometer running at 500 MHz using chloroform-d as a solvent with TMS as an internal standard. Mass spectra were obtained using an LCQ Fleet mass spectrometer with high resolution.
Comprehensive Material Characterization
(XRD) pattern was recorded with a New D8 Advance X-ray diffractometer
(Bruker, USA) using Cu Kα radiation. Fourier-transform infrared
(FT-IR) spectra were acquired on a Nicolet iS10 IR spectrophotometer
(Thermo Fisher Scientific, USA) with the sample in potassium bromide
pellets. Thermogravimetric analysis (TGA) was conducted using a Q500
system (TA Instruments, USA) at a scan rate of 5 °C min–1 under an air atmosphere. The nitrogen adsorption–desorption
isotherm was obtained using a 3Flex surface characterization analyzer
(Micromeritics, USA) at −196 °C. The sample was vacuum-dried
at 100 °C overnight prior to analysis. Field-emission scanning
electron microscopy (FE-SEM) photographs were obtained on a SUPRA
55VP field-emission scanning electron microscope (Zeiss, Germany).
Zeta potential was evaluated using a Z-1000 electrophoretic light
scattering spectrophotometer (ELS, Otsuka Electronics, Japan).
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