Flexafm microscope

Manufactured by Nanosurf

The FlexAFM is an atomic force microscope (AFM) designed for high-resolution imaging and analysis of surfaces. It provides nanoscale resolution and is capable of measuring a wide range of sample properties, including topography, stiffness, and electrical characteristics. The FlexAFM is a versatile instrument suitable for a variety of applications in materials science, nanotechnology, and life sciences.

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FlexAFM (36 citations) FlexAFM atomic force microscope (5 citations) FlexAFM microscope system (2 citations)

2 protocols using flexafm microscope

Magnetic Force Microscopy Imaging Protocol

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MFM images were carried out using a Nanosurf FlexAFM microscope. We used MagneticMulti75-G MFM tips from Budget Sensors, they are coated by a cobalt alloy hav- ing magnetic moment of roughly 10⁻¹⁶ Am² and coercivity of roughly 0.03 T. We operated the MFM measurements at the dynamic force mode with a resonant frequency of about 75 kHz. The images were acquired in the tip-surface distance of 60 nm. To acquire images in different areas, we moved the sample over distances of 1 mm in order to confirm the homogeneity of the domain magnetic patterns.

Brandão J., Dugato D.A., Seeger R.L., Denardin J.C., Mori T.J, & Cezar J.C. (2019). Observation of magnetic skyrmions in unpatterned symmetric multilayers at room temperature and zero magnetic field. Scientific Reports, 9, 4144.

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Atomic Force Microscopy of Film Surfaces

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AFM images of film surface topographies were obtained at room temperature with a Nanosurf FlexAFM microscope working in contact mode. Setpoints and gains were adjusted for each measurement to obtain a clear image without noise. Each film topography was investigated by collecting images at several randomly chosen areas. The images were processed using WSxM 4.0 software.36 (link)

Majcher A.M., Dąbczyński P., Marzec M.M., Ceglarska M., Rysz J., Bernasik A., Ohkoshi S.I, & Stefańczyk O. (2018). Between single ion magnets and macromolecules: a polymer/transition metal-based semi-solid solution †Electronic supplementary information (ESI) available: structural data for the Co-based SIM compounds; photographs of the obtained mononuclear crystalline compounds; comparison of microelemental analysis results and ICP + MS for 1, 2, example bulk P4VP with CoBr2, and P4VP alone; Fourier-transform infrared spectroscopy (FTIR) measurement results for 1, 2, bulk P4VP with CoBr2 and P4VP alone; P4VP with CoBr2 geometry optimization results; AC magnetic susceptibility vs. frequency for 1 and 2; AC magnetization versus frequency for the bulk CoBr2–P4VP; thin film roughness from AFM measurements; XPS analysis for unmodified and modified P4VP thin films and the bulk P4VP with CoBr2; ellipsometry measured film thicknesses; SIMS supplementary data for the obtained films; crystallographic information file with the structures of the mononuclear compounds 1 and 2 (cif). CCDC 1811487 and 1811488. For ESI and crystallographic data in CIF or other electronic format see DOI: 10.1039/c8sc02277a. Chemical Science, 9(36), 7277-7286.

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