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S 4800

Manufactured by Horiba
Sourced in Japan

The S-4800 is a scanning electron microscope (SEM) manufactured by Horiba. It is designed to provide high-resolution imaging of samples at the nanometer scale. The S-4800 utilizes a field emission electron gun and advanced optics to deliver exceptional image quality and resolution.

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6 protocols using s 4800

1

Characterization of Pt Nanoparticles on rGO/PEDOT:PSS(EG) Catalysts

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XRD spectra of the catalysts were collected using Rigaku Smart Lab SE X-ray diffractometer (Cu-Kα radiation at λ = 0.15406 nm). The average crystallite size of the nanoparticles was estimated using the Debye–Scherrer eqn (1):28,34 (link) where Z is the diameter of the average crystallite size (angstrom or nm); λ is the X-ray wavelength (1.5406 A) for Cu Kα; θ is the Bragg angle; k is the Scherrer constant (typically from 0.9 to 1.0); B is the full width at half maximum.
AFM was used to study the sample's surface morphology and dispersion of Pt nanoparticles on PEDOT:PSS and PEDOT:PSS(EG) using a Nanotec Electronica SPM with and without the EG. The images were processed with WsxM software (v3.1).
The morphology of rGO/PEDOT:PSS(EG)/Pt was characterized by a FESEM (Hitachi, S-4800) and an EDS (HORIBA, EX-250) coupled on the FESEM was used to confirm the component of the rGO/PEDOT:PSS(EG)/Pt.
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2

Comprehensive Materials Characterization

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The products were
characterized by
SEM (Hitachi, S-4800), Raman spectroscopy (Horiba, XploRA) with 532
nm excitation wavelength, and TEM (TOPCON EM-002B).
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3

Microstructural and Optical Characterization

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The phases of the product was characterized by XRD (Bruker D8 Advance X-ray diffractometer, Germany) using Cu Kα1 radiation (λ = 1.5406 Å) with a step of 0.02° (2θ) and a scanning rate of 4°/min. The existence of chemical bonds were proven by Fourier transform infrared spectroscopy (FT-IR; Nicolet IR100/200 spectrophotometer, USA) in the wavenumber range 1200–600 cm−1. The microstructure was investigated by field-emission FESEM (Hitachi S-4800, Japan), EDS (Horiba, UK), and TEM/HRTEM (FEI Tecnai G2 F20, USA, an accelerating voltage of 200 keV). The PL property was measured using a fluorescence spectrophotometer (Hitachi F-4600, Japan) at room temperature under a Xe lamp excitation.
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4

Structural Analysis of BC Membranes

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To examine the structural properties of the pure freeze-dried BC/K.h, and BC/K.h-Nis membranes, as well as BC/Rhiz and BC/Rhiz-Nis membranes, the BC membranes were fractured using liquid nitrogen, attached to a substrate with carbon tape, and coated with a thin layer of gold. The internal microstructure of the BC membranes, with a focus on the impregnation of nisin nanoparticles into the BC matrix, was observed using FE-SEM (Hitachi S-4800 and EDX-350 (Horiba), Tokyo, Japan) at an accelerating voltage of 10 kV at room temperature.
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5

SEM Surface Morphology Analysis

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Samples are affixed to the foundation of the scanning electron microscope (HITACHI S-4800, HORIBA EMAX400, Kyoto, Japan) with carbon tape, and observed for the surface morphology at an operation voltage of 15 kV.
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6

Multimodal Characterization of Catalysts

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The morphology and
element compositions were studied on a field-emission scanning electron
microscopy (FE-SEM, Hitachi-S4800, 3 kV) system equipped with a Horiba
Scientific energy dispersive spectrometer and using transmission electron
microscopy (TEM, Hitachi HF-3300, 300 kV). The crystal structures
of all catalysts were examined by powder X-ray diffraction (XRD, Rigaku
MiniFlex600). The composition of the catalyst was studied using X-ray
photoelectron spectroscopy (XPS, Thermo-Scientific ESCALAB 250Xi).
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