Single-crystal X-ray
diffraction (SCXRD) measurements were performed at room temperature
on a Bruker D8 Venture diffractometer operating at 50 kV and 1.4 mA
equipped with a Photon 3 CMOS detector, a flat graphite monochromator,
and a Mo Kα IμS 3.0 microfocus source (λ = 0.71073
Å). The raw frame data were collected using the Bruker APEX3
software package (Bruker AXS, 2015), while the frames were integrated
with the Bruker SAINT program using a narrow-frame algorithm for the
integration of the data; absorption effects were corrected using the
multi-scan method (SADABS).28 (link) Initial models
of the crystal structures were obtained with the program SHELXT-201429 (link) and refined using the program SHELXL-201430 (link) within the APEX3 software package. The atomic
displacement parameters were refined anisotropically for all atoms.
Diamond (Crystal Impact Gmbh, 2015) was used for the structure visualization.
diffraction (SCXRD) measurements were performed at room temperature
on a Bruker D8 Venture diffractometer operating at 50 kV and 1.4 mA
equipped with a Photon 3 CMOS detector, a flat graphite monochromator,
and a Mo Kα IμS 3.0 microfocus source (λ = 0.71073
Å). The raw frame data were collected using the Bruker APEX3
software package (Bruker AXS, 2015), while the frames were integrated
with the Bruker SAINT program using a narrow-frame algorithm for the
integration of the data; absorption effects were corrected using the
multi-scan method (SADABS).28 (link) Initial models
of the crystal structures were obtained with the program SHELXT-201429 (link) and refined using the program SHELXL-201430 (link) within the APEX3 software package. The atomic
displacement parameters were refined anisotropically for all atoms.
Diamond (Crystal Impact Gmbh, 2015) was used for the structure visualization.
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