Scanning Electron Microscopy Analysis of Ulvan

In order to gain insight into the morphology and surface texture, the partially purified ulvan from U. lactuca was studied using high-resolution scanning electron microscopy (HRSEM; JSM-IT 200, Jeol, Japan) under high vacuum, acceleration voltage of 15 kV, and large field detector. The sample for SEM analysis was prepared by coating with gold (15°A) for 2 min by physical vapor deposition [24 (link), 28 (link)]. Additionally, the quantitative elemental composition of the polysaccharide was analyzed using a scanning electron microscope–energy dispersive X-ray (SEM–EDX) spectrometer. No pretreatment was performed for the EDX measurement. The weight and atomic percentages of the different elements in the sample were related to the emitted X-rays [32 (link)].