The surface microstructures of the specimens were evaluated using a scanning electron microscope (SEM; JSM-7800F Prime, JEOL, Tokyo, Japan) at an accelerating voltage of 5.0 kV and a working distance (WD) of 6.0 mm at 3000×, 10,000×, and 30,000× magnifications (n = 1).
Surface Characterization of Plasma-Treated Samples
The surface microstructures of the specimens were evaluated using a scanning electron microscope (SEM; JSM-7800F Prime, JEOL, Tokyo, Japan) at an accelerating voltage of 5.0 kV and a working distance (WD) of 6.0 mm at 3000×, 10,000×, and 30,000× magnifications (n = 1).
Corresponding Organization : Ajou University
Variable analysis
- Type of plasma treatment
- Arithmetical mean height (Sa)
- Root mean square height (Sq)
- Maximum pit height (Sv)
- Surface microstructures
- Magnification (50×)
- Measurement area (256 × 192 μm^2)
- Number of measurements (n = 5 for CLSM, n = 1 for SEM)
- Accelerating voltage (5.0 kV) and working distance (6.0 mm) for SEM
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