To measure roughness, we used AFM (NaioAFM, Nanosurf, Basel, Switzerland). It was calibrated according to the manufacturer's instructions, and a 10 × 10 µm scan size was used for all samples. Roughness values (Ra) were calculated by the software of the device (Naio control software, v.3.10.0, Nanosurf, Basel, Switzerland) and reported in nanometers [20 (link)].
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